Eman Gawish (6 results)

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  • Language: English

    Published by LAP LAMBERT Academic Publishing, 2015

    3659660906 / 9783659660900

    • Softcover

    Seller: preigu, Osnabrück, Germanypreigu

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    Taschenbuch. Condition: Neu. Variability Tolerant Networks on Chip | Eman Gawish | Taschenbuch | 132 S. | Englisch | 2015 | LAP LAMBERT Academic Publishing | EAN 9783659660900 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.…

  • Language: English

    Published by LAP LAMBERT Academic Publishing, 2015

    3659660906 / 9783659660900

    • Softcover

    Seller: Mispah books, Redhill, SURRE, United KingdomMispah books

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    paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

  • Language: English

    Published by LAP LAMBERT Academic Publishing Apr 2015, 2015

    3659660906 / 9783659660900

    • Softcover
    • Print on Demand

    Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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    Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -NoC have been successfully replacing interconnects in multi-core chip. As technology scales down, process variations cause NoC links designed to be identical to have different electrical properties. We propose statistical design methodology that uses a statistical guard to tolerate variations with lower guard than conventional worst-case design. Thus saving power at low failure rate. A variability-aware NoC topology and geometry scaling, in addition to topology evaluation from variation perspective help the designer to perform scaling and choose the topology with lower variations for different technology nodes and NoC size. Finally, variability-aware routing algorithms make use of process variability link failure probability and adapt routing to reduce the NoC failure rate. 132 pp. Englisch.…

  • Language: English

    Published by LAP LAMBERT Academic Publishing, 2015

    3659660906 / 9783659660900

    • Softcover
    • Print on Demand

    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - NoC have been successfully replacing interconnects in multi-core chip. As technology scales down, process variations cause NoC links designed to be identical to have different electrical properties. We propose statistical design methodology that uses a statistical guard to tolerate variations with lower guard than conventional worst-case design. Thus saving power at low failure rate. A variability-aware NoC topology and geometry scaling, in addition to topology evaluation from variation perspective help the designer to perform scaling and choose the topology with lower variations for different technology nodes and NoC size. Finally, variability-aware routing algorithms make use of process variability link failure probability and adapt routing to reduce the NoC failure rate.…

  • Language: English

    Published by LAP LAMBERT Academic Publishing, 2015

    3659660906 / 9783659660900

    • Softcover
    • Print on Demand

    Seller: moluna, Greven, Germanymoluna

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Gawish EmanEman Kamel Gawish received the Ph.D. in Electronics and Electrical Communications Engineering from Cairo University, Giza, Egypt, in 2013. Her general research interests are in advanced system architectures, especially net.…

  • Language: English

    Published by LAP LAMBERT Academic Publishing Apr 2015, 2015

    3659660906 / 9783659660900

    • Softcover
    • Print on Demand

    Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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    Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -NoC have been successfully replacing interconnects in multi-core chip. As technology scales down, process variations cause NoC links designed to be identical to have different electrical properties. We propose statistical design methodology that uses a statistical guard to tolerate variations with lower guard than conventional worst-case design. Thus saving power at low failure rate. A variability-aware NoC topology and geometry scaling, in addition to topology evaluation from variation perspective help the designer to perform scaling and choose the topology with lower variations for different technology nodes and NoC size. Finally, variability-aware routing algorithms make use of process variability link failure probability and adapt routing to reduce the NoC failure rate.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 132 pp. Englisch.…