Order Total (1 Item Items):
Shipping Destination:
Droppo James (13 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (13)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (9)
- As New, Fine or Near Fine (4)
- Very Good or Good (No further results match this refinement)
- Fair or Poor (No further results match this refinement)
- As Described (No further results match this refinement)
Binding
Collectible Attributes
- First Edition (No further results match this refinement)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (5)
- Not Print on Demand (11)
Language (1)
Price
- Any Price
- Under £ 20 (No further results match this refinement)
- £ 20 to £ 35 (No further results match this refinement)
- Over £ 35
Free Shipping
- Free Shipping to U.S.A. (No further results match this refinement)
Seller Location
Seller Rating
-
Condition: As New. Unread book in perfect condition.
-
Condition: New.
-
Condition: New.
-
Risk Methodologies for Technological Legacies
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
-
Risk Methodologies for Technological Legacies
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
-
Risk Methodologies for Technological Legacies
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
-
Risk Methodologies for Technological Legacies
Language: English
Published by Kluwer Academic Publishers, 2003
ISBN 10: 1402012578 ISBN 13: 9781402012570
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. Proceedings of the NATO Advanced Study Institute, Bourgas, Bulgaria from 2 to 11 May 2000 Editor(s): Bley, Dennis; Eremenko, Vitaly A.; Droppo, James G. Series: NATO Science Series IV. Num Pages: 366 pages, biography. BIC Classification: GPQD; KJMD; RN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 244 x 170 x 22. Weight in Grams: 1610. . 2003. Hardback. . . . .
-
Paperback. Condition: Brand New. 1st edition. 400 pages. 9.25x6.25x0.75 inches. In Stock.
-
Risk Methodologies for Technological Legacies
Language: English
Published by Kluwer Academic Publishers, 2003
ISBN 10: 1402012578 ISBN 13: 9781402012570
Condition: New. Proceedings of the NATO Advanced Study Institute, Bourgas, Bulgaria from 2 to 11 May 2000 Editor(s): Bley, Dennis; Eremenko, Vitaly A.; Droppo, James G. Series: NATO Science Series IV. Num Pages: 366 pages, biography. BIC Classification: GPQD; KJMD; RN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 244 x 170 x 22. Weight in Grams: 1610. . 2003. Hardback. . . . . Books ship from the US and Ireland.
-
Risk Methodologies for Technological Legacies
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
-
Condition: As New. Unread book in perfect condition.
-
Risk Methodologies for Technological Legacies
Language: English
Published by Springer Netherlands, 2003
ISBN 10: 1402012578 ISBN 13: 9781402012570
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Proceedings of the NATO Advanced Study Institute, Bourgas, Bulgaria from 2 to 11 May 2000 The Cold War Era left the major participants, the United States and the former Soviet Union (FSU), with large legacies in terms of both contamination and potentia.
-
Risk Methodologies for Technological Legacies
Language: English
Published by Springer Netherlands, 2003
ISBN 10: 1402012586 ISBN 13: 9781402012587
Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Proceedings of the NATO Advanced Study Institute, Bourgas, Bulgaria from 2 to 11 May 2000 The Cold War Era left the major participants, the United States and the former Soviet Union (FSU), with large legacies in terms of both contamination and potentia.
