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Introduction to Statistics in Metrology
Seller: Books From California, Simi Valley, CA, U.S.A.
Seller rating 4 out of 5 stars
hardcover. Condition: Very Good.
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Condition: As New. Unread book in perfect condition.
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Condition: New.
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Introduction to Statistics in Metrology
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 107.12
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Introduction to Statistics in Metrology
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 107.12
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Introduction to Statistics in Metrology
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 107.11
£ 15 shipping
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Introduction to Statistics in Metrology
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 119.03
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Condition: New. pp. 347.
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Condition: New.
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Hardcover. Condition: New. New. book.
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Hardcover. Condition: Brand New. 368 pages. 9.25x6.10x0.91 inches. In Stock.
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Introduction to Statistics in Metrology
Language: English
Published by Springer International Publishing, 2020
ISBN 10: 303053328X ISBN 13: 9783030533281
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides R code to support the included methodologiesDraws from case studies used in the National Security Enterprise (NSE)Offers a detailed explanation of uncertainty analysis using the Monte Carlo m.
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Introduction to Statistics in Metrology
Language: English
Published by Springer, Berlin|Springer International Publishing|Springer, 2021
ISBN 10: 303053331X ISBN 13: 9783030533311
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced sp.
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Condition: New. Print on Demand pp. 347.
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Condition: New. Print on Demand.
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Condition: New. PRINT ON DEMAND pp. 347.
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Condition: New. PRINT ON DEMAND.
