Bender Emmanuel (16 results)
Published by Preuves, 1963
- Softcover
Seller: Abraxas-libris, Bécherel, FranceAbraxas-libris
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Add to basketRevue. Revue grand in-8 (25.5*18.5), dos broché, 96pp., Raymond Aron : Développement, rationalité et raison ; Roger Caillois : Approche du fantastique ; Hans Bender : En gondole (nouvelle) ; Alfred Frisch : L'équilibre Europe - Afrique : Jacques Carat : Les premiers adieux de Vilar ; Gerda Zeltner : Jean Cayrol, un romancier de…l'incertitude, etc. ; bon état. Livraison a domicile (La Poste) ou en Mondial Relay sur simple demande. Preuves.
- Hardcover
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- Hardcover
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Condition: New. 1st edition NO-PA16APR2015-KAP.
- Hardcover
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- Hardcover
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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- Hardcover
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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£ 106.37
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Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Condition: New. In.
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Seller: Rarewaves.com USA, London, LONDO, United KingdomRarewaves.com USA
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Hardback. Condition: New. RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality and Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over th…e lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the 'physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditionsDetailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and moreNew multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Condition: As New. Unread book in perfect condition.
- Hardcover
- First Edition
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.
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Condition: New. 2024. 1st Edition. hardcover. . . . . .
- Hardcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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Condition: New. 2024. 1st Edition. hardcover. . . . . . Books ship from the US and Ireland.
Reliability Prediction for Microelectronics
Joseph B. Bernstein, Alain (Universite Paris-Dauphine et INRIA) Bensoussan, Emmanuel Bender
- Hardcover
Seller: Buchpark, Trebbin, GermanyBuchpark
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Condition: Gut. Zustand: Gut | Seiten: 384 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Seller: Rarewaves.com UK, London, United KingdomRarewaves.com UK
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Hardback. Condition: New. RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality and Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over th…e lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the 'physics of failure', combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditionsDetailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and moreNew multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
Reliability Prediction for Microelectronics Joseph B. Bernstein, Alain (Universite Paris-Dauphine et INRIA) Bensoussan, Emmanuel Bender
Joseph B. Bernstein, Alain (Universite Paris-Dauphine et INRIA) Bensoussan, Emmanuel Bender
- Hardcover
Seller: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, GermanyBUCHSERVICE / ANTIQUARIAT Lars Lutzer
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Hardcover. Condition: gut. 2024. Reliability Prediction for Microelectronics In englischer Sprache. pages.
