Athreya Arjun (36 results)

Language: English
Published by Springer, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
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Language: English
Published by Springer, 2022
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Hardcover
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Language: English
Published by Springer International Publishing AG, CH, 2022
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Hardcover
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Hardback. Condition: New. 2023 ed. This book comprises chapters authored by experts who are professors and researchers in internationally recognized universities and research institutions. The book presents the results of research and descriptions of real-world systems, services, and technologies. Reading this book, researchers,… professional practitioners, and graduate students will gain a clear vision on the state of the art of the research and real-world practice on system dependability and analytics.The book is published in honor of Professor Ravishankar K. Iyer, the George and Ann Fisher Distinguished Professor in the Department of Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign (UIUC), Urbana, Illinois. Professor Iyer is ACM Fellow, IEEE Fellow, AAAS Fellow, and served as Interim Vice Chancellor of UIUC for research during 2008-2011. The book contains chapters written by many of his former students.

Language: English
Published by Springer, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
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Language: English
Published by Springer, 2022
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Hardcover
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Language: English
Published by Springer International Publishing AG, CH, 2022
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Hardcover
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Hardback. Condition: New. 2023 ed.

System Dependability and Analytics : Approaching System Dependability from Data, System and Analytics Perspectives
Wang, Long (EDT); Pattabiraman, Karthik (EDT); Di Martino, Catello (EDT); Athreya, Arjun (EDT); Bagchi, Saurabh (EDT)
Language: English
Published by Springer, 2022
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Hardcover
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Language: English
Published by Springer, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
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Language: English
Published by Springer, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
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Language: English
Published by Springer, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
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Language: English
Published by Springer, 2022
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Hardcover
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Language: English
Published by Springer, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
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System Dependability and Analytics : Approaching System Dependability from Data, System and Analytics Perspectives
Wang, Long (EDT); Pattabiraman, Karthik (EDT); Di Martino, Catello (EDT); Athreya, Arjun (EDT); Bagchi, Saurabh (EDT)
Language: English
Published by Springer, 2022
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Hardcover
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Language: English
Published by Springer, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
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More imagesLanguage: English
Published by Springer, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
Seller: preigu, Osnabrück, Germanypreigu
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Taschenbuch. Condition: Neu. System Dependability and Analytics | Approaching System Dependability from Data, System and Analytics Perspectives | Long Wang (u. a.) | Taschenbuch | xi | Englisch | 2023 | Springer | EAN 9783031020650 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, ju…ergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Language: English
Published by Springer, 2022
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Hardcover
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System Dependability and Analytics : Approaching System Dependability from Data, System and Analytics Perspectives
Wang, Long (EDT); Pattabiraman, Karthik (EDT); Di Martino, Catello (EDT); Athreya, Arjun (EDT); Bagchi, Saurabh (EDT)
Language: English
Published by Springer, 2022
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Hardcover
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Language: English
Published by Springer, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
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Language: English
Published by Springer, 2022
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New. 1st ed. 2023 edition NO-PA16APR2015-KAP.

Language: English
Published by Springer International Publishing, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book comprises chapters authored by experts who are professors and researchers in internationally recognized universities and research institutions. The book presents the results of research and descriptions of real-world systems, services, an…d technologies. Reading this book, researchers, professional practitioners, and graduate students will gain a clear vision on the state of the art of the research and real-world practice on system dependability and analytics.The book is published in honor of Professor Ravishankar K. Iyer, the George and Ann Fisher Distinguished Professor in the Department of Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign (UIUC), Urbana, Illinois. Professor Iyer is ACM Fellow, IEEE Fellow, AAAS Fellow, and served as Interim Vice Chancellor of UIUC for research during 2008-2011. The book contains chapters written by many of his former students.

System Dependability and Analytics: Approaching System Dependability from Data, System and Analytics Perspectives (Springer Series in Reliability Engineering)
Wang, Long (Editor) / Pattabiraman, Karthik (Editor) / Di Martino, Catello (Editor) / Athreya, Arjun (Editor) / Bagchi, Saurabh (Editor)
Language: English
Published by Springer, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Paperback. Condition: Brand New. 444 pages. 9.25x6.10x1.38 inches. In Stock.

Language: English
Published by Springer, 2022
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Hardcover
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Hardcover. Condition: Brand New. 444 pages. 9.25x6.10x1.00 inches. In Stock.

Language: English
Published by Springer, 2022
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Hardcover
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Language: English
Published by Springer International Publishing AG, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
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Language: English
Published by Springer International Publishing AG, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
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Language: English
Published by Springer, 2022
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Hardcover
- Print on Demand
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Language: English
Published by Springer, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
- Print on Demand
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Language: English
Published by Springer International Publishing, 2022
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Hardcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Collects the state-of-the-art research on dependability and analyticsIncludes the latest resulting from approaching system dependability from data, system and analytics perspectivesIs contributed to many int…ernationally recognized experts.

Language: English
Published by Springer International Publishing, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
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£ 143.42
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Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Collects the state-of-the-art research on dependability and analyticsIncludes the latest resulting from approaching system dependability from data, system and analytics perspectivesIs contribu…ted to many internationally recognized experts.

Language: English
Published by Springer International Publishing Jul 2023, 2023
Series: Book 79 of 90 - Springer Series in Reliability Engineering
- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book comprises chapters authored by experts who are professors and researchers in internationally recognized universities and research institutions. The book presents the results of research and descriptions of real-world syste…ms, services, and technologies. Reading this book, researchers, professional practitioners, and graduate students will gain a clear vision on the state of the art of the research and real-world practice on system dependability and analytics.The book is published in honor of Professor Ravishankar K. Iyer, the George and Ann Fisher Distinguished Professor in the Department of Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign (UIUC), Urbana, Illinois. Professor Iyer is ACM Fellow, IEEE Fellow, AAAS Fellow, and served as Interim Vice Chancellor of UIUC for research during 2008-2011. The book contains chapters written by many of his former students. 448 pp. Englisch.