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VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers
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Paperback. Condition: Brand New. 220 pages. 9.18x6.12x9.21 inches. In Stock.
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VLSI Design and Test: 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers (Communications in Computer and Information Science)
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VLSI Design and Test : 26th International Symposium, VDAT 2022, Jammu, India, July 17¿19, 2022, Revised Selected Papers
Published by Springer Nature Switzerland, 2022
ISBN 10: 3031215133 ISBN 13: 9783031215131
Language: English
£ 95.61
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Add to basketTaschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
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VLSI Design and Test
Published by Springer Nature Switzerland, Springer International Publishing Dez 2022, 2022
ISBN 10: 3031215133 ISBN 13: 9783031215131
Language: English
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Add to basketTaschenbuch. Condition: Neu. Neuware -The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 616 pp. Englisch.
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Energy Efficient and Reliable Embedded Nanoscale Sram Design
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Energy Efficient and Reliable Embedded Nanoscale Sram Design
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Paperback. Condition: Brand New. 614 pages. 9.25x6.10x1.42 inches. In Stock.
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VLSI Design and Test
Published by Springer Nature B.V., 2022
ISBN 10: 303121515X ISBN 13: 9783031215155
Language: English
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Add to basketPAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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VLSI Design and Test
Published by Springer Nature B.V., 2022
ISBN 10: 303121515X ISBN 13: 9783031215155
Language: English
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Add to basketPAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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Paperback. Condition: Brand New. 220 pages. 9.18x6.12 inches. In Stock. This item is printed on demand.
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Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Bhupendra Singh Reniwal received B. Tech & M. Tech from SGSITS-Indore and Ph.D. from IIT, Indore, India in 2006, 2011 and 2016 respectively. He is currently working as Assistant Professor in the Department of Electrical Engineering, Indian Institute .
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VLSI Design and Test
Published by Springer, Berlin|Springer Nature Switzerland|Springer, 2023
ISBN 10: 3031215133 ISBN 13: 9783031215131
Language: English
£ 82.46
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Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and s.
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VLSI Design and Test
Published by Springer Nature Switzerland Dez 2022, 2022
ISBN 10: 3031215133 ISBN 13: 9783031215131
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
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Add to basketTaschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design. 616 pp. Englisch.
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