Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability: 37 (Frontiers in Electronic Testing, 37) - Hardcover

Book 19 of 40: Frontiers in Electronic Testing
 
9780387747460: Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability: 37 (Frontiers in Electronic Testing, 37)

Synopsis

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

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From the Back Cover

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

"About this title" may belong to another edition of this title.

Other Popular Editions of the Same Title

9781441945136: Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability: 37 (Frontiers in Electronic Testing, 37)

Featured Edition

ISBN 10:  144194513X ISBN 13:  9781441945136
Publisher: Springer, 2010
Softcover