Published by Springer US, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
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235 x 155 mm. 2008. 408 Seiten Ehemaliges Bibliotheksexemplar mit Signatur und Stempel, moderate Gebrauchsspuren, Guter Zustand. 9780387747460 Sprache: Deutsch Gewicht in Gramm: 550.
Published by Springer, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
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Condition: New. pp. 424.
Published by Springer, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
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Published by Springer, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
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Published by Springer, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
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Published by Springer, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
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Published by Springer, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
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Published by Springer, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
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Published by Springer, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
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Published by Springer, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
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Published by Springer, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
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Published by Springer US Dez 2007, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field. 424 pp. Englisch.
Published by Springer US, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
Seller: moluna, Greven, Germany
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Covers various technologies that have been suggested by researchers over the last decadesIncludes technologies such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), nanowires and carbon nanotubesDiscus.
Published by Springer US, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
Seller: AHA-BUCH GmbH, Einbeck, Germany
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
Published by Springer, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
Seller: GreatBookPricesUK, Castle Donington, DERBY, United Kingdom
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Published by Springer Verlag, 2008
ISBN 10: 038774746X ISBN 13: 9780387747460
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Hardcover. Condition: NEW. 1st edition. 405 pages. 9.25x6.25x1.00 inches. In Stock.
Published by Springer-Verlag New York Inc., 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Condition: New. An account of strengths and disadvantages of new technologies, including chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata, nanowires and carbon nanotubes. The book offers a single source of reference in a rapidly changing field. Editor(s): Tehranipoor, Mohammad. Series: Frontiers in Electronic Testing. Num Pages: 420 pages, 200 black & white illustrations, biography. BIC Classification: TBN. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 23. Weight in Grams: 769. . 2007. Hardback. . . . .
Published by Springer, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
Seller: ALLBOOKS1, Parafield, SA, Australia
Published by Springer-Verlag New York Inc., 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
Seller: Kennys Bookstore, Olney, MD, U.S.A.
Condition: New. An account of strengths and disadvantages of new technologies, including chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata, nanowires and carbon nanotubes. The book offers a single source of reference in a rapidly changing field. Editor(s): Tehranipoor, Mohammad. Series: Frontiers in Electronic Testing. Num Pages: 420 pages, 200 black & white illustrations, biography. BIC Classification: TBN. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 23. Weight in Grams: 769. . 2007. Hardback. . . . . Books ship from the US and Ireland.