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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability: 37 (Frontiers in Electronic Testing, 37) - Softcover
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.
Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
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- PublisherSpringer
- Publication date2010
- ISBN 10 144194513X
- ISBN 13 9781441945136
- BindingPaperback
- Number of pages420
- EditorTehranipoor Mohammad
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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing, 37)
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Emerging Nanotechnologies
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Book Description Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Covers various technologies that have been suggested by researchers over the last decadesIncludes technologies such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), nanowires and carbon nanotubesDiscus. Seller Inventory # 4174860
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Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability
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Book Description Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field. Seller Inventory # 9781441945136
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Book Description Paperback. Condition: Brand New. 420 pages. 9.09x6.10x0.98 inches. In Stock. Seller Inventory # x-144194513X
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Emerging Nanotechnologies
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Book Description Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field. 420 pp. Englisch. Seller Inventory # 9781441945136
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Emerging Nanotechnologies
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Book Description Condition: New. An account of strengths and disadvantages of new technologies, including chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata, nanowires and carbon nanotubes. The book offers a single source of reference in a rapidly changing field. Editor(s): Tehranipoor, Mohammad. Series: Frontiers in Electronic Testing. Num Pages: 420 pages, 200 black & white illustrations, biography. BIC Classification: TBN. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 21. Weight in Grams: 640. . 2010. 1st ed. Softcover of orig. ed. 2008. Paperback. . . . . Seller Inventory # V9781441945136
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Emerging Nanotechnologies : Test; Defect Tolerance; and Reliability
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Book Description Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Seller Inventory # ria9781441945136_lsuk
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