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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing, 37)
Book 19 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 137.84
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability
Book 19 of 40: Frontiers in Electronic TestingLanguage: English
Published by Springer US, Springer US, 2010
ISBN 10: 144194513X ISBN 13: 9781441945136
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing, 37)
Book 19 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 189.04
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Paperback. Condition: Brand New. 420 pages. 9.09x6.10x0.98 inches. In Stock.
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Hardcover. Condition: Brand New. 1st edition. 405 pages. 9.25x6.25x1.00 inches. In Stock.
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability
Book 19 of 40: Frontiers in Electronic TestingLanguage: English
Published by Copernicus, Springer US, 2007
ISBN 10: 038774746X ISBN 13: 9780387747460
Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality.Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.
