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Yield Variability Optimization Integrated by Jian Cheng (13 results)
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Condition: New.
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Yield and Variability Optimization of Integrated Circuits
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.15
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
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Yield and Variability Optimization of Integrated Circuits
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.15
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Yield and Variability Optimization of Integrated Circuits
Language: English
Published by Kluwer Academic Publishers, 1995
ISBN 10: 0792395514 ISBN 13: 9780792395515
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. Deals with the primary and theoretical and practical aspects of IC statistical design and covers the important issues of IC statistical design and the relevant mathematical framework. This book is intended as introductory reference material for various groups of IC designers. Num Pages: 234 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 15. Weight in Grams: 542. . 1995. Hardback. . . . .
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Taschenbuch. Condition: Neu. Yield and Variability Optimization of Integrated Circuits | Jian Cheng Zhang (u. a.) | Taschenbuch | xvii | Englisch | 2012 | Springer | EAN 9781461359357 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Yield and Variability Optimization of Integrated Circuits
Language: English
Published by Kluwer Academic Publishers, 1995
ISBN 10: 0792395514 ISBN 13: 9780792395515
Condition: New. Deals with the primary and theoretical and practical aspects of IC statistical design and covers the important issues of IC statistical design and the relevant mathematical framework. This book is intended as introductory reference material for various groups of IC designers. Num Pages: 234 pages, biography. BIC Classification: TJFC; TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 15. Weight in Grams: 542. . 1995. Hardback. . . . . Books ship from the US and Ireland.
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: new. Questo è un articolo print on demand.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances oft.
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances oft.
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Yield and Variability Optimization of Integrated Circuits
Language: English
Published by Springer, Springer Nov 2012, 2012
ISBN 10: 146135935X ISBN 13: 9781461359357
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances ofthe IC manufacturing process, the actual performancesof the mass produced chips are different than those for the nominal design. Even if the manufacturing process were tightly controlled, so that there were little variations across the chips manufactured, the environmentalchanges (e. g. those oftemperature, supply voltages, etc. ) would alsomakethe circuit performances vary during the circuit life span. Process-related performance variations may lead to low manufacturing yield, and unacceptable product quality. For these reasons, statistical circuit design techniques are required to design the circuit parameters, taking the statistical process variations into account. This book deals with some theoretical and practical aspects of IC statistical design, and emphasizes how they differ from those for discrete circuits. It de scribes a spectrum of different statistical design problems, such as parametric yield optimization, generalized on-target design, variability minimization, per formance tunning, and worst-case design. The main emphasis of the presen tation is placed on the principles and practical solutions for performance vari ability minimization. It is hoped that the book may serve as an introductory reference material for various groups of IC designers, and the methodologies described will help them enhance the circuit quality and manufacturability. The book containsseven chapters.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 256 pp. Englisch.
