Yield and Variability Optimization of Integrated Circuits

Language: English

Published by Springer US, 2012

146135935X / 9781461359357

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Traditionally, Computer Aided Design (CAD) tools have been used to create the nominal design of an integrated circuit (IC), such that the circuit nominal response meets the desired performance specifications. In reality, however, due to the disturbances oft.

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Title
Yield and Variability Optimization of Integrated Circuits
Author
Jian Cheng Zhang|M.A. Styblinski
Publisher
Springer US
Publication year
2012
Condition
New
Binding
Soft cover
Language
English
ISBN 10
146135935X
ISBN 13
9781461359357

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item16 to 45 business days16 to 45 business days
First item£ 42.05£ 42.05
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