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X Ray Diffraction Elevated Temperatures Method by Chung Deborah (2 results)
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X-ray Diffraction at Elevated Temperatures: A Method for In Situ Process Analysis.
Language: English
Published by New York, NY: VCH., 1993
Seller: Antiquariat Thomas Haker GmbH & Co. KG, Berlin, Germany
Association Member: GIAQ
Seller rating 5 out of 5 stars
Hardcover. Condition: Sehr gut. VIII, 268 S., with numerous figures, As library copy in very good condition. Sprache: Englisch Gewicht in Gramm: 725.
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Condition: Sehr gut. Zustand: Sehr gut | Seiten: 268 | Sprache: Deutsch | Produktart: Bücher | Keine Beschreibung verfügbar.
