X-Ray Diffraction at Elevated Temperatures: A Method for In Situ Process Analysis

Chung, Deborah D; Detlaven, Patrick W; Arnold, H; Ghosh, Debastis

ISBN 10: 3527278427 ISBN 13: 9783527278428
Published by Wiley-VCH, 1993
Language: English
Condition: Used - Fine Hardcover

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Used - Hardcover

Condition: Used - Fine

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