Order Total (1 Item Items):
Shipping Destination:
Unified Methods Vlsi Simulation Test by Cheng Kwang Ting Agrawal Vishwani (7 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (7)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
Binding
- All Bindings
- Hardcover (7)
- Softcover (No further results match this refinement)
Collectible Attributes
- First Edition (No further results match this refinement)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (4)
- Not Print on Demand (6)
Language (2)
Free Shipping
- Free Shipping to U.S.A. (No further results match this refinement)
Seller Location
Seller Rating
-
hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
-
Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
Seller: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Seller rating 4 out of 5 stars
Condition: acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact.
-
-
Unified Methods for VLSI Simulation and Test Generation:
Published by Boston. Kluwer Academic, 1989
ISBN 10: 0792390253 ISBN 13: 9780792390251
Language: English
Seller: avelibro OHG, Dinkelscherben, Germany
Association Member: BOEV
Seller rating 5 out of 5 stars
8° , Hardcover/Pappeinband. Condition: Sehr gut. XII, 148 Seiten. Mit Illustrationen. Ausgetragenes Bibliotheksexemplar mit Inventaraufkleber auf Rücken und Vorsatz. Leihkarte in Tasche am Nachsatz. In sehr gutem Zustand. DE-10-19e Sprache: Englisch Gewicht in Gramm: 435.
-
Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In.
-
Unified Methods for VLSI Simulation and Test Generation
Seller: Celler Versandantiquariat, Eicklingen, Germany
Association Member: GIAQ
Seller rating 5 out of 5 stars
Kluwer, Boston, 1989. XII, 148 pages with some graphics, hard cover----former library book in good condition- 428 Gramm.
-
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt.
