Thermal Testing Integrated Circuits by Altet Rubio (21 results)

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  • Language: English

    Published by Springer, 2002

    1402070764 / 9781402070761

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    Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

  • Language: English

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    1402070764 / 9781402070761

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  • Language: English

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  • Language: English

    Published by Springer, 2002

    1402070764 / 9781402070761

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  • Language: English

    Published by Springer, 2002

    1402070764 / 9781402070761

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  • Language: English

    Published by Springer, 2002

    1402070764 / 9781402070761

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  • Language: English

    Published by Springer, 2011

    144195287X / 9781441952875

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  • Language: English

    Published by Kluwer Academic Publishers, 2002

    1402070764 / 9781402070761

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    Condition: New. Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. Abnormal status of this variable, both too high and too low, is sign of abnormal behavior in electronic systems. This title presents the feasibility to consider temperature as an observable for testing purpo

  • Language: English

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    Condition: New. pp. 226.

  • Language: English

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  • Language: English

    Published by Springer, 2012

    144195287X / 9781441952875

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    Paperback. Condition: Brand New. 224 pages. 9.20x6.10x0.60 inches. In Stock.

  • Language: English

    Published by Springer US, 2002

    1402070764 / 9781402070761

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    Condition: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Integrated circuits (IC's) have undergone a significant evolution in terms of complexity and performance as a result 'of the substantial advances made in manufacturing technology. Circuits, in their various mixed formats, can be made up tens or even hundreds

  • Language: English

    Published by Springer, 2002

    1402070764 / 9781402070761

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  • Language: English

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  • Language: English

    Published by Kluwer Academic Pub, 2002

    1402070764 / 9781402070761

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    Hardcover. Condition: Brand New. 1st edition. 224 pages. 9.50x6.25x0.50 inches. In Stock.

  • Language: English

    Published by Kluwer Academic Publishers, 2002

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    Condition: New. Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. Abnormal status of this variable, both too high and too low, is sign of abnormal behavior in electronic systems. This title presents the feasibility to consider temperature as an observable for testing purpo

  • Language: English

    Published by Springer, 2011

    144195287X / 9781441952875

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  • Language: English

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    1402070764 / 9781402070761

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    Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for te

  • Language: English

    Published by Springer US, 2011

    144195287X / 9781441952875

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purp

  • Language: English

    Published by Springer, 2011

    144195287X / 9781441952875

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    Condition: New. Print on Demand pp. 226 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

  • Language: English

    Published by Springer, 2011

    144195287X / 9781441952875

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    Condition: New. PRINT ON DEMAND pp. 226.