Surface Roughness Study Atomic by Sayeed Md Abu (6 results)

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    • Language: English

      Published by LAP LAMBERT Academic Publishing, 2012

      3848400359 / 9783848400355

      • Softcover

      Seller: Books Puddle, New York, NY, U.S.A.Books Puddle

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    • Language: English

      Published by LAP Lambert Academic Publishing, 2012

      3848400359 / 9783848400355

      • Softcover

      Seller: preigu, Osnabrück, Germanypreigu

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      Taschenbuch. Condition: Neu. Surface Roughness Study by Atomic Force Microscopy | Surface Roughness-Practical Example | [.] Sayeed (u. a.) | Taschenbuch | Englisch | LAP Lambert Academic Publishing | EAN 9783848400355 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]pre

    • Language: English

      Published by LAP LAMBERT Academic Publishing, 2012

      3848400359 / 9783848400355

      • Softcover
      • Print on Demand

      Seller: Majestic Books, Hounslow, United KingdomMajestic Books

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    • Language: English

      Published by LAP LAMBERT Academic Publishing, 2012

      3848400359 / 9783848400355

      • Softcover
      • Print on Demand

      Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

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    • Language: English

      Published by LAP LAMBERT Academic Publishing, 2012

      3848400359 / 9783848400355

      • Softcover
      • Print on Demand

      Seller: moluna, Greven, Germanymoluna

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      Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Sayeed Md.AbuMd.Abu Sayeed has completed his Bachelor of science in Electrical & Electronic Engineering from Khulna University of Engineering & Technology,Bangladesh.AFM is becoming a key technique in m

    • Language: English

      Published by LAP Lambert Academic Publishing, 2012

      3848400359 / 9783848400355

      • Softcover
      • Print on Demand

      Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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      Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces an