Items related to Surface Roughness Study by Atomic Force Microscopy:...

Surface Roughness Study by Atomic Force Microscopy: Surface Roughness-Practical Example - Softcover

Sayeed, Md.Abu; Ferdous, Zakia

 
9783848400355: Surface Roughness Study by Atomic Force Microscopy: Surface Roughness-Practical Example
Softcover
ISBN 10: 3848400359 ISBN 13: 9783848400355
Publisher: LAP LAMBERT Academic Publishing, 2012

Synopsis

AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.

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About the Author

Md.Abu Sayeed has completed his Bachelor of science in Electrical & Electronic Engineering from Khulna University of Engineering & Technology,Bangladesh.

"About this title" may belong to another edition of this title.

Publisher
LAP LAMBERT Academic Publishing
Publication date
2012
Language
English
ISBN 10 
3848400359
ISBN 13 
9783848400355
Binding
Paperback
Number of pages
72