Soft Error Reliability Vlsi by Ghavami Behnam (20 results)

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  • Language: English

    Published by Springer, 2020

    3030516091 / 9783030516093

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  • Language: English

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  • Language: English

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  • Language: English

    Published by Springer, 2021

    3030516121 / 9783030516123

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  • Language: English

    Published by Springer, 2020

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  • Language: English

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    Condition: New. 1st ed. 2021 edition NO-PA16APR2015-KAP.

  • Language: English

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    3030516091 / 9783030516093

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  • Language: English

    Published by Springer Nature, 2020

    3030516091 / 9783030516093

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    Hardcover. Condition: Brand New. 127 pages. 9.25x6.10x9.21 inches. In Stock.

  • Language: English

    Published by Springer, 2020

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    Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today's reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimationand GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

  • Language: English

    Published by Springer, 2021

    3030516121 / 9783030516123

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    Taschenbuch. Condition: Neu. Soft Error Reliability of VLSI Circuits | Analysis and Mitigation Techniques | Behnam Ghavami (u. a.) | Taschenbuch | xiii | Englisch | 2021 | Springer | EAN 9783030516123 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

  • Language: English

    Published by Springer, 2020

    3030516091 / 9783030516093

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  • Language: English

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  • Language: English

    Published by Springer, 2021

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  • Language: English

    Published by Springer, 2021

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  • Language: English

    Published by Springer, Berlin|Springer International Publishing|Springer, 2021

    3030516121 / 9783030516123

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniqu.

  • Language: English

    Published by Springer International Publishing, 2020

    3030516091 / 9783030516093

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides an accessible, comprehensive introduction to soft errorsDescribes an easy to follow procedure for modeling, analysis, and estimation of soft error rate of digital circuitsIncludes state-of-the art soft error aware CAD algorithms.

  • Language: English

    Published by Palgrave Macmillan, 2021

    3030516121 / 9783030516123

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    Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today's reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimationand GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.

  • Language: English

    Published by Springer, Springer Okt 2021, 2021

    3030516121 / 9783030516123

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    Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today¿s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimationand GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 128 pp. Englisch.

  • Language: English

    Published by Springer, Springer Okt 2020, 2020

    3030516091 / 9783030516093

    • Hardcover
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    Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today¿s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimationand GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 128 pp. Englisch.