Soc Testing Plug Play by Chakrabarty Krishnendu (34 results)
Language: English
Published by Kluwer Academic. 2002
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
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First Edition. 18 x 25 cm. 208 pages. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
Language: English
Published by Springer 2002
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
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Language: English
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Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
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Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
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Published by Springer 2011
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
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Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
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Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
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Language: English
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Language: English
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Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
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Condition: Used. pp. 212.
Language: English
Published by Springer 2002
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
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Condition: Used. pp. 212 Illus.
Language: English
Published by Springer 2011
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
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Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
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Condition: Used. pp. 212.
Language: English
Published by Springer 2011
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
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Language: English
Published by Kluwer Academic Publishers 2002
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
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Condition: New. System-on-a-Chip (SOC) integrated circuits composed of embedded cores are commonplace. Nevertheless, there remain several roadblocks to efficient system integration. This work contains thirteen contributions that address various aspects of SOC testing. It is suitable for researchers and students interested in var…ious aspects of SOC testing. Series: Frontiers in Electronic Testing. Num Pages: 200 pages, biography. BIC Classification: TJFD. Category: (UU) Undergraduate. Dimension: 279 x 210 x 12. Weight in Grams: 588. . 2002. New ed. Hardback. . . . .
Language: English
Published by Springer US 2011
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
- Softcover
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Paperback. Condition: Brand New. 216 pages. 10.00x7.01x0.47 inches. In Stock.
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Published by Springer 2011
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
- Softcover
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Taschenbuch. Condition: Neu. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation | Krishnendu Chakrabarty | Taschenbuch | Frontiers in Electronic Testing | viii | Englisch | 2011 | Springer | EAN 9781441953070 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot…]hartmann[at]springer[dot]com | Anbieter: preigu.
Language: English
Published by Kluwer Academic Publishers 2002
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
- Hardcover
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Condition: New. System-on-a-Chip (SOC) integrated circuits composed of embedded cores are commonplace. Nevertheless, there remain several roadblocks to efficient system integration. This work contains thirteen contributions that address various aspects of SOC testing. It is suitable for researchers and students interested in var…ious aspects of SOC testing. Series: Frontiers in Electronic Testing. Num Pages: 200 pages, biography. BIC Classification: TJFD. Category: (UU) Undergraduate. Dimension: 279 x 210 x 12. Weight in Grams: 588. . 2002. New ed. Hardback. . . . . Books ship from the US and Ireland.
Language: English
Published by Springer US 2011
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
- Softcover
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and man…ufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Language: English
Published by Springer US, Springer US 2002
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufactur…ing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing.
Language: English
Published by Springer 2002
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
- Hardcover
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Language: English
Published by Kluwer Academic 2002
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
- Hardcover
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Published by Springer 2002
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Published by Springer 2011
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
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Language: English
Published by Springer US, Springer US Dez 2011 2011
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
- Softcover
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SO…C design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing. 212 pp. Englisch.
Language: English
Published by Springer US 2011
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- Softcover
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major b…ottleneck in SOC design and manufactu.
Language: English
Published by Springer US 2002
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as… a major bottleneck in SOC design and manufactu.
Language: English
Published by Springer 2011
Series: Frontiers in Electronic Testing, Book 36 of 40. Book 36 of 40 - Frontiers in Electronic Testing
- Softcover
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Condition: New. Print on Demand pp. 212 66:B&W 7 x 10 in or 254 x 178 mm Perfect Bound on White w/Gloss Lam.
Language: English
Published by Springer 2011
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- Softcover
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Condition: New. PRINT ON DEMAND pp. 212.
