Order Total (1 Item Items):
Shipping Destination:
Semiconductor Material Device Characterization by Schroder Dieter (33 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (33)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
Binding
- All Bindings
- Hardcover (33)
- Softcover (No further results match this refinement)
Collectible Attributes
- First Edition (1)
- Signed (No further results match this refinement)
- Dust Jacket (2)
- Seller-Supplied Images (6)
- Not Print on Demand (31)
Language (1)
Free Shipping
Seller Location
Seller Rating
-
Condition: acceptable. Fairly worn, but readable and intact. If applicable: Dust jacket, disc or access code may not be included.
-
Hardcover. Condition: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.
-
Hardcover. Condition: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
-
Semiconductor Material and Device Characterization
Language: English
Published by Wiley & Sons, Incorporated, John, 1990
ISBN 10: 0471511048 ISBN 13: 9780471511045
Condition: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
-
Semiconductor Material and Device Characterization
Language: English
Published by Wiley & Sons, Incorporated, John, 1990
ISBN 10: 0471511048 ISBN 13: 9780471511045
Seller: Better World Books Ltd, Dunfermline, United Kingdom
Seller rating 5 out of 5 stars
Condition: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
-
Semiconductor Material and Device Characterization
Seller: World of Books (was SecondSale), Montgomery, IL, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. Item in good condition. Textbooks may not include supplemental items i.e. CDs, access codes etc.
-
Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
-
Condition: good. All pages and cover are intact including the dust cover, if applicable . Spine may show signs of wear. Pages may include limited notes and highlighting. May include "From the library of" labels. Shrink wrap, dust covers, or boxed set case may be missing. Item may be missing bundled media.
-
Semiconductor Material and Device Characterization
Seller: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Seller rating 5 out of 5 stars
Condition: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.
-
Semiconductor Material and Device Characterization
Language: English
Published by Wiley-Interscience, NY, 1998
ISBN 10: 0471241393 ISBN 13: 9780471241393
Hardcover. Condition: Very Fine. Second Edition. No markings.
-
Semiconductor Material and Device Characterization
Language: English
Published by Somerset, New Jersey, U.S.A.: John Wiley & Sons Inc, 1990
ISBN 10: 0471511048 ISBN 13: 9780471511045
Hardcover. Condition: Near Fine. Dust Jacket Condition: Near Fine. hardback book and dust jacket in near fine condition.
-
Semiconductor Material and Device Characterization
Language: English
Published by John Wiley & Sons Inc, NY, 1990
ISBN 10: 0471511048 ISBN 13: 9780471511045
Hardcover. Condition: Fine.
-
Semiconductor Material and Device Characterization (IEEE Press)
Language: English
Published by Wiley-IEEE Press (edition 3), 2015
ISBN 10: 0471739065 ISBN 13: 9780471739067
Hardcover. Condition: Very Good. 3. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.
-
Semiconductor Material and Device Characterization (IEEE Press)
Seller: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Seller rating 5 out of 5 stars
Condition: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.
-
Semiconductor Material and Device Characterization - 1st Edition/1st Printing
Language: English
Published by John Wiley & Sons, Inc., New York, 1990
ISBN 10: 0471511048 ISBN 13: 9780471511045
Seller: Books Tell You Why - ABAA/ILAB, Summerville, SC, U.S.A.
Seller rating 2 out of 5 stars
First Edition
Hardcover. Condition: Near Fine. Dust Jacket Condition: Near Fine. First Edition; First Printing. A handsome first edition/first printing in Near Fine condition with previous owner's signature to front flyleaf in alike dust-jacket with light edgewear. [i-iv] v-vii [viii] ix-xv [xvi-xviii], 1-599 [600-6] pages; Book is written for graduate students and industrial researchers who want to learn more about the wide spectrum of measurement methods found in the modern semiconductor industry ; 8vo.
-
Semiconductor Material and Device Characterization (IEEE Press)
Seller: Phatpocket Limited, Waltham Abbey, HERTS, United Kingdom
Seller rating 5 out of 5 stars
Condition: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
-
Hardcover. Condition: New.
-
Condition: as new. Wie neu/Like new.
-
Condition: Gut. Zustand: Gut | Seiten: 600 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
-
Semiconductor Material and Device Characterization
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
-
Condition: New.
-
Condition: new.
-
Condition: As New. Unread book in perfect condition.
-
Semiconductor Material And Device Characterization
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 172.02
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
-
Condition: New. pp. 800 Illus.
-
Semiconductor Material and Device Characterization
Language: English
Published by John Wiley and Sons Ltd, 2006
ISBN 10: 0471739065 ISBN 13: 9780471739067
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Num Pages: 800 pages, illustrations. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 238 x 164 x 42. Weight in Grams: 1199. . 2006. 3rd Edition. Hardcover. . . . .
-
Semiconductor Material And Device Characterization
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 216.10
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
-
Condition: New. pp. 800 Index 3rd Edition.
-
Semiconductor Material and Device Characterization
Language: English
Published by John Wiley and Sons Ltd, 2015
ISBN 10: 0471739065 ISBN 13: 9780471739067
Condition: New. This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Num Pages: 800 pages, illustrations. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 238 x 164 x 42. Weight in Grams: 1199. . 2006. 3rd Edition. Hardcover. . . . . Books ship from the US and Ireland.
-
Hardcover. Condition: Brand New. 3rd edition. 779 pages. 9.25x6.25x1.50 inches. In Stock.
