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Paperback. Condition: Good. Good condition paperback. Pages are clean and unmarked. Minor edgewear. Book has a slight lean to the right. Tulsa's largest used bookstore. Located on South Mingo Road since 1991. No-hassle return policy if not completely satisfied.
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Condition: Good. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Condition: New. pp. xviii + 555.
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Condition: New. pp. xviii + 555 Illus.
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Condition: New. pp. xviii + 555.
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Scanning Probe Microscopy of Functional Materials : Nanoscale Imaging and Spectroscopy
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 187.59
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Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 187.59
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Ships from United Kingdom to U.S.A.Quantity: Over 20 available
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Condition: As New. Unread book in perfect condition.
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Scanning Probe Microscopy of Functional Materials : Nanoscale Imaging and Spectroscopy
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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£ 203.72
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Condition: New. pp. 573.
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Taschenbuch. Condition: Neu. Scanning Probe Microscopy of Functional Materials | Nanoscale Imaging and Spectroscopy | Alexei Gruverman (u. a.) | Taschenbuch | xviii | Englisch | 2016 | Springer US | EAN 9781493939473 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Scanning Probe Microscopy of Functional Materials : Nanoscale Imaging and Spectroscopy
Language: English
Published by Springer New York, Springer US, 2016
ISBN 10: 1493939475 ISBN 13: 9781493939473
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport andmagnetic, optical, and electromechanical properties.By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this bookprovides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.
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Scanning Probe Microscopy of Functional Materials : Nanoscale Imaging and Spectroscopy
Language: English
Published by Springer New York, Springer New York, 2010
ISBN 10: 144196567X ISBN 13: 9781441965677
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport andmagnetic, optical, and electromechanical properties.By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this bookprovides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.
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Hardcover. Condition: Brand New. 600 pages. 9.20x6.40x1.10 inches. In Stock.
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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study ... II: Mathematics, Physics and Chemistry, 186)
Book 147 of 241: NATO Science Series II: Mathematics, Physics and ChemistrySeller: Ria Christie Collections, Uxbridge, United Kingdom
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£ 258.71
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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials: Proceedings of the NATO Advanced Study ... II: Mathematics, Physics and Chemistry, 186)
Book 147 of 241: NATO Science Series II: Mathematics, Physics and ChemistrySeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 258.71
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Book 147 of 241: NATO Science Series II: Mathematics, Physics and ChemistryLanguage: English
Published by Springer Netherlands, 2005
ISBN 10: 1402030177 ISBN 13: 9781402030178
Gebunden. Condition: New. As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming.
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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Book 147 of 241: NATO Science Series II: Mathematics, Physics and ChemistryLanguage: English
Published by Springer Netherlands, 2005
ISBN 10: 1402030185 ISBN 13: 9781402030185
Kartoniert / Broschiert. Condition: New. As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming.
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Paperback. Condition: Brand New. 1st edition. 488 pages. 9.25x6.25x1.25 inches. In Stock.
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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials : Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002
Book 147 of 241: NATO Science Series II: Mathematics, Physics and ChemistryTaschenbuch. Condition: Neu. Neuware - As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials : Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002
Book 147 of 241: NATO Science Series II: Mathematics, Physics and ChemistryBuch. Condition: Neu. Neuware - As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
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Condition: new. Questo è un articolo print on demand.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Serves the rapidly developing field of nanoscale characterization of functional materials propertiesCovers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductorsFocuses.
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Serves the rapidly developing field of nanoscale characterization of functional materials propertiesCovers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductorsFocuses.
