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Scanning Force Microscopy Applications by Sarid Dror (13 results)
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series on Optical Sciences)
Published by Oxford University Press, USA, 1991
ISBN 10: 0195062701 ISBN 13: 9780195062700
Language: English
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. 272 pp., hardcover, ex library, else text clean & binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences #2)
Published by Oxford University Press April 1991, 1991
ISBN 10: 0195062701 ISBN 13: 9780195062700
Language: English
Hardcover. Condition: Very Good. Support Small Business by buying this book! Previous owner's name on inside front cover. Binding is tight and square. Previous owners name stamped on edge. No dust jacket as issued.
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series on Optical and Imaging Sciences)
Published by U.S.A.: Oxford University Press, 1994
ISBN 10: 019509204X ISBN 13: 9780195092042
Language: English
Hardcover. Condition: Good. 2nd Edition. REVISED HARDBACK BOOK IN GOOD TO VERY GOOD CONDITION,BOOK IS SLIGHTLY TWISTED.
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces
Published by Oxford University Press, 1994
ISBN 10: 019509204X ISBN 13: 9780195092042
Language: English
£ 20.69
Convert currency£ 12.94 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780195092042.
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces - Oxford Series in Optical and Imaging Sciences - Revised Edition
Published by Oxford University Press, New York, 1994
ISBN 10: 019509204X ISBN 13: 9780195092042
Language: English
Hard Back. Condition: Very Good. Dust Jacket Condition: No Dust Jacket. Revised Edition - Third Printing. 263 Pages Indexed. Solid book in great condition. High interest and major advances in the technology of scanning force microscopy that have taken place since the 1991 release has made this Revised Edition necessary. The tenth anniversary of Scanning Tunneling Microscopy, celebrated at the Sixth International Conference on Scanning Tunneling Microscopy in Interlaken, Switzerland August 12-16, 1991, with more than one thousand participants, produced three volumes of papers that attest to the ever-growing interest in this technology. As the field of scanning force microscopy has matured, a gradual shift in gears has taken place, from activities involving the development of instruments to their use as probes in a large rainbow of disciplines. Therefore, this new print, which includes all the material contained in the first print, additionally has the latest available list of new references that deal with electric, magnetic, and atomic force microscopy. It should also be noted that several scanning force microscopy related reviews have appeared, some of which present detailed information on specialized topics. Contents in 13 Chapters: Mechanical Properties of Levers, Resonance Enhancement, Sources of Noise, Tuneling Detection System, Capacitance Detection System, Homodyne Detection System, Heterodyne Detection System, Laser-Diode Feedback Detection System, Polarization Detection System, Deflection System, Electric Force Microscopy, Magnetic Force Microscopy, and Atomic Force Microscopy.
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£ 24.84
Convert currency£ 90.88 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketCondition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Scanning Force Microscopy : With Applications to Electric, Magnetic and Atomic Forces
Published by Oxford University Press, 1994
ISBN 10: 019509204X ISBN 13: 9780195092042
Language: English
Condition: New.
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences)
Published by Oxford University Press, 1994
ISBN 10: 019509204X ISBN 13: 9780195092042
Language: English
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 130.70
Convert currency£ 11.98 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Scanning Force Microscopy : With Applications to Electric, Magnetic and Atomic Forces
Published by Oxford University Press, 1994
ISBN 10: 019509204X ISBN 13: 9780195092042
Language: English
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 130.69
Convert currency£ 15 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Scanning Force Microscopy : With Applications to Electric, Magnetic and Atomic Forces
Published by Oxford University Press, 1994
ISBN 10: 019509204X ISBN 13: 9780195092042
Language: English
Condition: As New. Unread book in perfect condition.
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences, 5)
Published by Oxford University Press, 1994
ISBN 10: 019509204X ISBN 13: 9780195092042
Language: English
Hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
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Scanning Force Microscopy : With Applications to Electric, Magnetic and Atomic Forces
Published by Oxford University Press, 1994
ISBN 10: 019509204X ISBN 13: 9780195092042
Language: English
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 148.09
Convert currency£ 15 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces (eng)
Published by Oxford University Press, 1994
ISBN 10: 019509204X ISBN 13: 9780195092042
Language: English
£ 167.60
Convert currency£ 5.89 shipping from Italy to U.S.A.Quantity: Over 20 available
Add to basketCondition: new. Questo è un articolo print on demand.
