Quantitative X Ray Diffractometry by Zevin Kimmel (5 results)
Language: English
Published by Springer Verlag, 1995
- Hardcover
Seller: Librairie Parrêsia, Figeac, FranceLibrairie Parrêsia
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Dec 06, 1995. Condition: Used: Good. Quantitative X-Ray Diffractometry | Zevin - Kimmel | Springer Verlag New-York Berlin, 1995, in-8° cartonnage éditeur de 372 pages. Couverture propre. Dos solide. Intérieur frais sans soulignage ou annotation. Exemplaire de bibliothèque : petit code barre en pied de 1re de couv., cotation au dos, rares et discrets petits tampons à l'intérieur de l'ouvrage. Très bon état général pour cet ouvrage. [T12].…
Language: English
Published by Springer, 2011
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Language: English
Published by Springer, 2011
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Condition: New. In English.
Language: English
Published by Springer, 2011
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Language: English
Published by Springer New York, 2011
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase.…
