Order Total (1 Item Items):
Shipping Destination:
Principles Semiconductor Network Testing by Afshar Amir (6 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (6)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (3)
- As New, Fine or Near Fine (1)
- Very Good or Good (2)
- Fair or Poor (No further results match this refinement)
- As Described (No further results match this refinement)
Binding
Collectible Attributes
- First Edition (2)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (No further results match this refinement)
- Not Print on Demand (6)
Language (1)
Free Shipping
- Free Shipping to U.S.A. (No further results match this refinement)
Seller Location
Seller Rating
-
Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
-
Principles of Semiconductor Network Testing (Test & Measurement)
Language: English
Published by Boston, MA: U.S.A.: Newnes / Butterworth Heinemann, 1995
ISBN 10: 0750694726 ISBN 13: 9780750694728
Seller: The Warm Springs Book Company, Fremont, CA, U.S.A.
Seller rating 5 out of 5 stars
First Edition
Hardcover. Condition: Fine. No Jacket. 1st Edition. A fine copy in pictorial boards issued w/o a DJ. 1st edition with complete number line. Illustrated; Contents: Preface; Diode and transistor operation; Integrated circuit test basics; Digital logic test; Noise identification; Operational amplifier general information; Data acquisition devices; Digital signal processing; CODEC (Coder/Decoder); References. 8vo., 213 pages.
-
Principles of Semiconductor Network Testing
Language: English
Published by Elsevier Science & Technology, 1996
ISBN 10: 0750694726 ISBN 13: 9780750694728
Seller: Better World Books Ltd, Dunfermline, United Kingdom
Seller rating 5 out of 5 stars
First Edition
Condition: Very Good. 1st Edition. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
-
-
hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
-
Paperback. Condition: Brand New. 236 pages. 9.35x6.00x0.54 inches. In Stock.
