A fine copy in pictorial boards issued w/o a DJ. 1st edition with complete number line. Illustrated; Contents: Preface; Diode and transistor operation; Integrated circuit test basics; Digital logic test; Noise identification; Operational amplifier general information; Data acquisition devices; Digital signal processing; CODEC (Coder/Decoder); References. 8vo., 213 pages.

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Bibliographic Details

Title

Principles of Semiconductor Network Testing (Test & Measurement)

Publisher

Boston, MA: U.S.A.: Newnes / Butterworth Heinemann

Publication Date

1995

Language

English

ISBN 10

0750694726

ISBN 13

9780750694728

Binding

Hardcover

Edition

1st Edition

Condition

Fine

Dust Jacket Condition

No Jacket

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About this title

Synopsis

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

Introduces a novel component-testing philosophy for semiconductor test, product and design engineers
Best new source of information for experienced semiconductor engineers as well as entry-level personnel
Eight chapters about semiconductor testing

Synopsis

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. It introduces a novel component-testing philosophy for semiconductor test, product and design engineers. It provides best new source of information for experienced semiconductor engineers as well as entry-level personnel. It includes eight chapters about semiconductor testing.

"About this title" may belong to another edition of this title.

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