Principles of Semiconductor Network Testing - Hardcover

Afshar, Amir

 
9780750694728: Principles of Semiconductor Network Testing

Synopsis

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

  • Introduces a novel component-testing philosophy for semiconductor test, product and design engineers
  • Best new source of information for experienced semiconductor engineers as well as entry-level personnel
  • Eight chapters about semiconductor testing

"synopsis" may belong to another edition of this title.

Synopsis

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. It introduces a novel component-testing philosophy for semiconductor test, product and design engineers. It provides best new source of information for experienced semiconductor engineers as well as entry-level personnel. It includes eight chapters about semiconductor testing.

"About this title" may belong to another edition of this title.

Other Popular Editions of the Same Title

9780123992710: Principles of Semiconductor Network Testing

Featured Edition

ISBN 10:  0123992710 ISBN 13:  9780123992710
Publisher: Newnes, 2011
Softcover