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Novel Algorithms Fast Statistical by Singhee Amith (17 results)
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits (Lecture Notes in Electrical Engineering, 46)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.15
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: New. pp. 212.
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Condition: New. pp. 212 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
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Condition: New. pp. 212.
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Condition: New. pp. 212.
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Paperback. Condition: Brand New. 2009 edition. 210 pages. 9.25x6.10x0.48 inches. In Stock.
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Taschenbuch. Condition: Neu. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits | Amith Singhee (u. a.) | Taschenbuch | Lecture Notes in Electrical Engineering | xv | Englisch | 2012 | Springer | EAN 9789400736870 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits (Lecture Notes in Electrical Engineering, 46)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 136.79
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: new. Questo è un articolo print on demand.
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Condition: new. Questo è un articolo print on demand.
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Language: English
Published by Springer Netherlands, 2012
ISBN 10: 9400736878 ISBN 13: 9789400736870
Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents flexible and general techniques for statistical analysis that can be applied to wide variety of circuit applicationsApplies theory from a wide variety of scientific fields (machine learning, computational finance, number theory, actuarial.
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Language: English
Published by Springer Netherlands, 2009
ISBN 10: 9048130999 ISBN 13: 9789048130993
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents flexible and general techniques for statistical analysis that can be applied to wide variety of circuit applicationsApplies theory from a wide variety of scientific fields (machine learning, computational finance, number theory, actuarial.
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Condition: New. Print on Demand pp. 212 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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Condition: New. PRINT ON DEMAND pp. 212.
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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Language: English
Published by Springer, Springer Mär 2012, 2012
ISBN 10: 9400736878 ISBN 13: 9789400736870
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 212 pp. Englisch.
