Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

Language: English

Published by Springer, Springer Mär 2012, 2012

9400736878 / 9789400736870

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This item is printed on demand - Print on Demand Titel. Neuware -As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 212 pp. Englisch.

Seller Inventory # 9789400736870

Title
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Author
Amith Singhee
Publisher
Springer, Springer Mär 2012
Publication year
2012
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
9400736878
ISBN 13
9789400736870
Item weight
330 grams
Dimensions
235x155x12 mm

buchversandmimpf2000

Emtmannsberg, BAYE, Germany

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AbeBooks seller since January 23, 2017

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