Order Total (1 Item Items):
Shipping Destination:
Multi Run Memory Tests Pattern by Mrozek Ireneusz (29 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (29)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (26)
- As New, Fine or Near Fine (2)
- Very Good or Good (No further results match this refinement)
- Fair or Poor (No further results match this refinement)
- As Described (1)
Binding
Collectible Attributes
- First Edition (No further results match this refinement)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (11)
- Not Print on Demand (19)
Language (1)
Free Shipping
Seller Location
Seller Rating
-
Multi-run Memory Tests for Pattern Sensitive Faults.
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 4 out of 5 stars
X, 135 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
-
Condition: New.
-
Hardback or Cased Book. Condition: New. Multi-Run Memory Tests for Pattern Sensitive Faults. Book.
-
Condition: As New. Unread book in perfect condition.
-
Multi-run Memory Tests for Pattern Sensitive Faults
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 50.80
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Multi-run Memory Tests for Pattern Sensitive Faults
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 50.80
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
PF. Condition: New.
-
Multi-run Memory Tests for Pattern Sensitive Faults
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
-
Condition: New. Softcover reprint of the original 1st ed. 2019 edition NO-PA16APR2015-KAP.
-
Multi-run Memory Tests For Pattern Sensi
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New.
-
Multi-run Memory Tests For Pattern Sensi
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New.
-
Multi-run Memory Tests for Pattern Sensitive Faults
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
-
Hardcover. Condition: Brand New. 148 pages. 9.25x6.10x0.67 inches. In Stock.
-
Condition: New.
-
Condition: New.
-
Multi-run Memory Tests for Pattern Sensitive Faults
Language: English
Published by Springer International Publishing, Springer International Publishing, 2019
ISBN 10: 3030081982 ISBN 13: 9783030081980
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations.
-
Multi-run Memory Tests for Pattern Sensitive Faults
Language: English
Published by Springer International Publishing, 2018
ISBN 10: 3319912038 ISBN 13: 9783319912035
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations.
-
Taschenbuch. Condition: Neu. Multi-run Memory Tests for Pattern Sensitive Faults | Ireneusz Mrozek | Taschenbuch | x | Englisch | 2019 | Springer | EAN 9783030081980 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
-
Paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
-
Condition: new. Questo è un articolo print on demand.
-
Condition: new. Questo è un articolo print on demand.
-
Multi-run Memory Tests for Pattern Sensitive Faults
Language: English
Published by Springer International Publishing Feb 2019, 2019
ISBN 10: 3030081982 ISBN 13: 9783030081980
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations. 148 pp. Englisch.
-
Multi-run Memory Tests for Pattern Sensitive Faults
Language: English
Published by Springer International Publishing Jul 2018, 2018
ISBN 10: 3319912038 ISBN 13: 9783319912035
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations. 148 pp. Englisch.
-
Condition: New. Print on Demand.
-
Condition: New. PRINT ON DEMAND.
-
Multi-run Memory Tests for Pattern Sensitive Faults
Language: English
Published by Springer International Publishing, 2019
ISBN 10: 3030081982 ISBN 13: 9783030081980
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing processPresents practical algorithms for design and implementation of efficient multi-run testsDemonstrates method.
-
Multi-run Memory Tests for Pattern Sensitive Faults
Language: English
Published by Springer International Publishing, 2018
ISBN 10: 3319912038 ISBN 13: 9783319912035
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing processPresents practical algorithms for design and implementation of efficient multi-run testsDemonstrates method.
-
Multi-run Memory Tests for Pattern Sensitive Faults
Language: English
Published by Springer, Springer Feb 2019, 2019
ISBN 10: 3030081982 ISBN 13: 9783030081980
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 148 pp. Englisch.
-
Multi-run Memory Tests for Pattern Sensitive Faults
Language: English
Published by Springer, Springer Jul 2018, 2018
ISBN 10: 3319912038 ISBN 13: 9783319912035
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 148 pp. Englisch.
