Multi Chip Module Test Strategies (20 results)
Language: English
Published by Springer 1997
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Hardcover
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Language: English
Published by Springer 1997
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Hardcover
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Condition: New. pp. 168.
Language: English
Published by Springer 2012
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Softcover
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Condition: New. pp. 167 1st Edition, Reprint.
Language: English
Published by Kluwer Academic Pub 1997
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Softcover
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Paperback. Condition: Brand New. 166 pages. 10.75x8.25x0.75 inches. In Stock.
Language: English
Published by Springer 2012
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Softcover
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Taschenbuch. Condition: Neu. Multi-Chip Module Test Strategies | Yervant Zorian | Taschenbuch | 167 S. | Englisch | 2012 | Springer | EAN 9781461377986 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Language: English
Published by Springer US 1997
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: moluna, Greven, Germanymoluna
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Condition: New. MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test .
Language: English
Published by Springer, Springer US 2012
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Tes…t Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).
Language: English
Published by Springerverlag Us 2012
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Paperback. Condition: Brand New. reprint edition. 167 pages. 10.24x7.68x0.38 inches. In Stock.
Language: English
Published by Springer Us 1997
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Buchpark, Trebbin, GermanyBuchpark
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Condition: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategi…es presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).
Language: English
Published by Springer 2012
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Softcover
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Language: English
Published by Springer 1997
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Language: English
Published by Springer Us Mai 1997 1997
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Buch. Condition: Neu. Neuware - MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strate…gies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).
Language: English
Published by Springer 2012
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Softcover
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Language: English
Published by Springer US Okt 2012 2012
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Softcover
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi…-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2). 168 pp. Englisch.
Language: English
Published by Springer US 2012
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to t…heir use. Multi-Chip Module Test .
Language: English
Published by Springer 1997
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Condition: New. Print on Demand pp. 168 68:B&W 7 x 10 in or 254 x 178 mm Case Laminate on White w/Gloss Lam.
Language: English
Published by Springer 2012
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Condition: New. Print on Demand pp. 167.
Language: English
Published by Springer 1997
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Hardcover
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Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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Condition: New. PRINT ON DEMAND pp. 168.
Language: English
Published by Springer 2012
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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Condition: New. PRINT ON DEMAND pp. 167.
Language: English
Published by Springer, Springer US Okt 2012 2012
Series: Frontiers in Electronic Testing, Book 2 of 40. Book 2 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chi…p Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain.Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 168 pp. Englisch.
