Multi-Chip Module Test Strategies

Language: English

Published by Springer US, 1997

079239920X / 9780792399209

Series: Book 2 of 40 - Frontiers in Electronic Testing

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  • New
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Seller: moluna, Greven, Germanymoluna

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MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test .

Seller Inventory # 5971820

Title
Multi-Chip Module Test Strategies
Author
Zorian, Yervant
Publisher
Springer US
Publication year
1997
Condition
New
Binding
Hardcover
Language
English
ISBN 10
079239920X
ISBN 13
9780792399209
Series
Book 2 of 40: Frontiers in Electronic Testing

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item26 to 60 business days26 to 60 business days
First item£ 42.12£ 42.12
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Moluna GmbH

Engberdingdamm 27
Greven, Germany 48268