Order Total (1 Item Items):
Shipping Destination:
Epioptics Linear Nonlinear Optical Spectroscopy (10 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (10)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (5)
- As New, Fine or Near Fine (1)
- Very Good or Good (3)
- Fair or Poor (No further results match this refinement)
- As Described (1)
Binding
Collectible Attributes
- First Edition (No further results match this refinement)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (2)
- Not Print on Demand (10)
Language (2)
Free Shipping
- Free Shipping to U.S.A. (No further results match this refinement)
Seller Location
Seller Rating
-
Hardcover. Condition: Good+. No Jacket. A little reading wear. Otherwsie a solid, unmarked volume.
-
Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces (ESPRIT Basic Research Series).
Published by Springer,, 1995
Sprache: Englisch Pappband. Noch eingeschweißtes Exemplar!
-
Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces (ESPRIT Basic Research Series)
Published by Springer, 1995
Hardcover. Condition: Very Good.
-
Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces (ESPRIT Basic Research Series)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 50.80
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces (ESPRIT Basic Research Series)
Language: English
Published by Springer Berlin Heidelberg 1995-01-01, 1995
ISBN 10: 3642798225 ISBN 13: 9783642798221
Paperback. Condition: New.
-
Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces (Esprit Basic Research Series)
Language: English
Published by Springer Berlin Heidelberg, 2012
ISBN 10: 3642798225 ISBN 13: 9783642798221
Paperback. Condition: Brand New. reprint edition. 242 pages. 9.25x6.10x0.80 inches. In Stock.
-
Epioptics : Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces
Language: English
Published by Springer Berlin Heidelberg, 2011
ISBN 10: 3642798225 ISBN 13: 9783642798221
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The study of condensed matter using optical techniques, where photons act as both probe and signal, has a long history. It is only recently, however, that the extraction of surface and interface information, with submonolayer resolution, has been shown to be possible using optical techniques (where 'optical' applies to electromagnetic radiation in and around the visible region of the spectrum). This book describes these 'epioptic' techniques, which have now been quite widely applied to semiconductor surfaces and interfaces. Particular emphasis in the book is placed on recent studies of submonolayer growth on well-characterised semiconductor surfaces, many of which have arisen from CEC DGJGII ESPRIT Basic Research Action No. 3177 'EPIOPTIC', and CEU DGIII ESPRIT Basic Research Action No. 6878 'EASI'. Techniques using other areas of the spectrum such as the infra-red region (IR spectroscopy, in its various surface configurations), and the x-ray region (surface x-ray diffraction, x-ray standing wave), are omitted. The optical techniques described use simple lamp or small laser sources and are thus, in principle, easily accessible. Epioptic probes can provide new information on solid-gas, solid-liquid and liquid-liquid interfaces. They are particularly suited to growth monitoring. Emerging process technologies for fabricating submicron and nanoscale semiconductor devices and novel multilayer materials, whether based on silicon or compound semiconductors, all require extremely precise control of growth at surfaces. In situ, non-destructive, real-time monitoring and characterisation of surfaces under growth conditions is needed for further progress. Both atomic scale resolution, and non-destructive characterisation of buried structures, are required.
-
Taschenbuch. Condition: Neu. Epioptics | Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces | John F. McGilp (u. a.) | Taschenbuch | ESPRIT Basic Research Series | xii | Englisch | 2011 | Springer | EAN 9783642798221 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
-
Paperback. Condition: Like New. Like New. book.
-
Epioptics : Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces
Language: English
Published by Springer-Verlag GmbH & Co. KG, 1995
ISBN 10: 3540594108 ISBN 13: 9783540594109
Condition: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
