Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces (ESPRIT Basic Research Series) - Hardcover
Synopsis
This text describes recent developments in optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These "epioptic" techniques are now widely applied to semiconductor surfaces and interfaces and include polarised reflection techniques such as reflection anisotropy spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epioptics has great potential in the area of growth monitoring, and in situ monitoring of semiconductor growth with submonolayer sensitivity has now been demonstrated in growth reactors under normal operating conditions. The book emphasizes recent studies of submonolayer growth on semiconductor surfaces.
"synopsis" may belong to another edition of this title.
Synopsis
This text describes recent developments in optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These "epioptic" techniques are now widely applied to semiconductor surfaces and interfaces and include polarised reflection techniques such as reflection anisotropy spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epioptics has great potential in the area of growth monitoring, and in situ monitoring of semiconductor growth with submonolayer sensitivity has now been demonstrated in growth reactors under normal operating conditions. The book emphasizes recent studies of submonolayer growth on semiconductor surfaces.
"About this title" may belong to another edition of this title.
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Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces
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Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces (ESPRIT Basic Research Series)
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Hardcover. Condition: Very Good. An investigation into optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These techniques have been widely applied to semiconductor surfaces and interfaces, and include polarised reflection techniques such as reflection anisotropy spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epitoptics' potential in the area of growth monitoring, and in situ monitoring of semiconductor growth with submonolayer sensitivity has been demonstrated in growth reactors under normal operating conditions. The book emphasizes studies of submonolayer growth on semiconductor surfaces. Chapters include: Spectroscopic Ellipsometry Reflection Difference Techniques Raman Spectroscopy Photoluminescence Spectroscopy On the Theory of Second Harmonic Generation Second Harmonic and Sum Frequency Generation Conclusions Hardback, pp230. Seller Inventory # ABE-1781099565163
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Epioptics : Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces
Published by
Springer-Verlag GmbH & Co. KG, 1995
ISBN 10: 3540594108
ISBN 13: 9783540594109
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Seller: Buchpark, Trebbin, Germany
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Condition: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar. Seller Inventory # 262743/203