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Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces (ESPRIT Basic Research Series) - Hardcover
Synopsis
This text describes recent developments in optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These "epioptic" techniques are now widely applied to semiconductor surfaces and interfaces and include polarised reflection techniques such as reflection anisotropy spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epioptics has great potential in the area of growth monitoring, and in situ monitoring of semiconductor growth with submonolayer sensitivity has now been demonstrated in growth reactors under normal operating conditions. The book emphasizes recent studies of submonolayer growth on semiconductor surfaces.
"synopsis" may belong to another edition of this title.
Synopsis
This text describes recent developments in optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These "epioptic" techniques are now widely applied to semiconductor surfaces and interfaces and include polarised reflection techniques such as reflection anisotropy spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epioptics has great potential in the area of growth monitoring, and in situ monitoring of semiconductor growth with submonolayer sensitivity has now been demonstrated in growth reactors under normal operating conditions. The book emphasizes recent studies of submonolayer growth on semiconductor surfaces.
"About this title" may belong to another edition of this title.
- PublisherSpringer-Verlag Berlin and Heidelberg GmbH & Co. K
- Publication date1995
- ISBN 10 3540594108
- ISBN 13 9783540594109
- BindingHardcover
- LanguageEnglish
- Number of pages242
- EditorMcGilp J.F., Etc., Weaire D., Patterson C.
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Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces
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Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces
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Epioptics : Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces
Published by
Springer-Verlag GmbH & Co. KG, 1995
ISBN 10: 3540594108
ISBN 13: 9783540594109
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Hardcover
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Condition: Gut. Zustand: Gut | Seiten: 242 | Sprache: Englisch | Produktart: Bücher. Seller Inventory # 262743/203
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