Encyclopedia Scanning Electron Microscopy by Lisa Page (21 results)

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Encyclopedia Of Scanning Electron Microscopy

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Language: English

Published by NY RESEARCH PRESS, 2015

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Encyclopedia of Scanning Electron Microscopy

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Encyclopedia of Scanning Electron Microscopy

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Encyclopedia of Scanning Electron Microscopy

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Encyclopedia of Scanning Electron Microscopy

Language: English

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Encyclopedia of Scanning Electron Microscopy

Language: English

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Encyclopedia of Scanning Electron Microscopy

Language: English

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Encyclopedia of Scanning Electron Microscopy

Language: English

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Encyclopedia of Scanning Electron Microscopy

Language: English

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Encyclopedia of Scanning Electron Microscopy

Language: English

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Encyclopedia of Scanning Electron Microscopy

Page, Lisa (Editor)

Language: English

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Encyclopedia of Scanning Electron Microscopy

Language: English

Published by NY RESEARCH PRESS, 2015

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Encyclopedia of Scanning Electron Microscopy

Language: English

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Encyclopedia of Scanning Electron Microscopy

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Encyclopedia of Scanning Electron Microscopy

Lisa Page

Language: English

Published by Ny Research Press, 2015

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Encyclopedia of Scanning Electron Microscopy

Language: English

Published by ML Books International - IPS, 2015

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Encyclopedia of Scanning Electron Microscopy

Language: English

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Encyclopedia of Scanning Electron Microscopy

Lisa Page

Language: English

Published by ML Books International - IPS, 2015

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Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. Numerous topics are covered under two sections 'Instrumentation, Methodology' and 'Biology, Medicine' for electronic industry. This book includes contributions by renowned researchers and experts in this field.…

Encyclopedia of Scanning Electron Microscopy

Language: English

Published by ML Books International - IPS, 2015

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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. KlappentextThis book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instru.…

Encyclopedia of Scanning Electron Microscopy

Lisa Page

Language: English

Published by ML Books International - IPS, 2015

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