Embedded Processor Based Self Test by Gizopoulos Dimitris (33 results)
Language: English
Published by New Age International Publisher 2009
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Softcover
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Condition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be print…ed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
Language: English
Published by New Age International Publisher 2009
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Softcover
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Language: English
Published by Springer 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
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Language: English
Published by Springer 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
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Language: English
Published by Springer 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
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Language: English
Published by Springer 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
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Language: English
Published by Springer 2011
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Softcover
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Language: English
Published by Humana Dez 2004 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
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Buch. Condition: Neu. Neuware -Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques f…ail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit's performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design.Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.
Language: English
Published by Springer 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
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Language: English
Published by Springer 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title.
More imagesLanguage: English
Published by Springer US 2011
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Softcover
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Taschenbuch. Condition: Neu. Embedded Processor-Based Self-Test | Dimitris Gizopoulos (u. a.) | Taschenbuch | xv | Englisch | 2011 | Springer US | EAN 9781441952523 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Language: English
Published by Springer US 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
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Buch. Condition: Neu. Embedded Processor-Based Self-Test | Dimitris Gizopoulos (u. a.) | Buch | Frontiers in Electronic Testing | xv | Englisch | 2004 | Springer US | EAN 9781402027857 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbiet…er: preigu.
Language: English
Published by Springer 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
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Condition: New. pp. 236.
Language: English
Published by Springer New York, Springer US 2011
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Softcover
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a chal…lenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit's performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design.Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.
Language: English
Published by Springer 2012
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Paperback. Condition: Brand New. 232 pages. 9.00x6.00x0.60 inches. In Stock.
Language: English
Published by Kluwer Academic Pub 2005
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
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Hardcover. Condition: Brand New. 1st edition. 216 pages. 9.50x6.50x0.50 inches. In Stock.
Language: English
Published by Springer 2011
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Softcover
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Language: English
Published by Springer 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
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Language: English
Published by Springer 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
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Language: English
Published by Springer 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
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Language: English
Published by Humana Dez 2004 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
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Buch. Condition: Neu. Neuware -Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a challenge because most traditional testing techniques f…ail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit's performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design.Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures. 236 pp. Englisch.
Language: English
Published by Springer 2011
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
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Language: English
Published by Kluwer Academic Pub 2005
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
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Hardcover. Condition: Brand New. 1st edition. 216 pages. 9.50x6.50x0.50 inches. In Stock. This item is printed on demand.
Language: English
Published by Humana Dez 2004 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: Rheinberg-Buch Andreas Meier eK, Bergisch Gladbach, GermanyRheinberg-Buch Andreas Meier eK
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always be…en a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design.Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures. 236 pp. Englisch.
Language: English
Published by Springer US Dez 2011 2011
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has al…ways been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit's performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design.Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures. 236 pp. Englisch.
Language: English
Published by Springer US 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Sets the framework for comparisons among different SBST methodologies by discussing key requirementsPresents successful applications of SBST to a number of embedded processors of different complexities and instruction… set architectures.
Language: English
Published by Humana Dez 2004 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always be…en a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design.Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures. 236 pp. Englisch.
Language: English
Published by Springer US 2011
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Sets the framework for comparisons among different SBST methodologies by discussing key requirementsPresents successful applications of SBST to a number of embedded processors of different complexities and instruction… set architectures.
Language: English
Published by Springer New York, Springer US Dez 2011 2011
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always… been a challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit¿s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design. Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment. Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.Libri GmbH, Europaallee 1, 36244 Bad Hersfeld 236 pp. Englisch.
Language: English
Published by Springer US, Springer US Dez 2004 2004
Series: Frontiers in Electronic Testing, Book 34 of 40. Book 34 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
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Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Embedded Processor-Based Self-Test is a guide to self-testing strategies for embedded processors. Embedded processors are regularly used today in most System-on-Chips (SoCs). Testing of microprocessors and embedded processors has always been a… challenge because most traditional testing techniques fail when applied to them. This is due to the complex sequential structure of processor architectures, which consists of high performance datapath units and sophisticated control logic for performance optimization. Structured Design-for-Testability (DfT) and hardware-based self-testing techniques, which usually have a non-trivial impact on a circuit¿s performance, size and power, can not be applied without serious consideration and careful incorporation into the processor design.Embedded Processor-Based Self-Test shows how the powerful embedded functionality that processors offer can be utilized as a self-testing resource. Through a discussion of different strategies the book emphasizes on the emerging area of Software-Based Self-Testing (SBST). SBST is based on the idea of execution of embedded software programs to perform self-testing of the processor itself and its surrounding blocks in the SoC. SBST is a low-cost strategy in terms of overhead (area, speed, power), development effort and test application cost, as it is applied using low-cost, low-speed test equipment.Embedded Processor-Based Self-Test can be used by designers, DfT engineers, test practitioners, researchers and students working on digital testing, and in particular processor and SoC test. This book sets the framework for comparisons among different SBST methodologies by discussing key requirements. It presents successful applications of SBST to a number of embedded processors of different complexities and instruction set architectures.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 236 pp. Englisch.
