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Digital shearography. Theory and application of digital speckle pattern shearing Interferometry.
Language: English
Published by Washington, Spie Press, 2003., 2003
ISBN 10: 0819441104 ISBN 13: 9780819441102
Seller: Antiquariat Carl Wegner, Berlin, B, Germany
Association Member: GIAQ
Seller rating 5 out of 5 stars
First Edition
Hardcover. 26 x 18 cm. Original black cardboard ribbon. XVII, 310 pages with many monochrome illustrations. Apparently unused book in good condition. --- Schwarzer originaler Pappband. XVII, 310 Seiten mit vielen einfarbigen Abbildungen. Offenbar unbenutztes Exemplar in gutem Zustand. -- Bitte Portokosten außerhalb EU erfragen! / Please ask for postage costs outside EU! / S ' il vous plait demander des frais de port en dehors de l ' UE! // Bitte beachten Sie auch unsere Fotos! / Please also note our photos! / Veuillez noter nos photos -- Der Juli wird heiß - was halten Sie von einem Buch über Reisen in kühlere Gegenden! -- Wir kaufen Ihre werthaltigen Bücher! Tech.
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Denoising in digital speckle pattern interferometry by Riesz wavelets
Language: English
Published by LAP LAMBERT Academic Publishing, 2018
ISBN 10: 6139873827 ISBN 13: 9786139873821
Paperback. Condition: Brand New. 56 pages. 8.66x5.91x0.13 inches. In Stock.
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Digital Shearography: Theory and Application of Digital Speckle Pattern Shearing Interferometry
Language: English
Published by Society of Photo Optical, 2002
ISBN 10: 0819441104 ISBN 13: 9780819441102
Hardcover. Condition: Brand New. illustrated edition. 330 pages. 10.00x7.25x1.00 inches. In Stock.
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Condition: As New. Unread book in perfect condition.
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Digital Shearography : Theory and Application of Digital Speckle Pattern Shearing Interferometry
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Denoising in digital speckle pattern interferometry by Riesz wavelets
Language: English
Published by LAP LAMBERT Academic Publishing, 2018
ISBN 10: 6139873827 ISBN 13: 9786139873821
Taschenbuch. Condition: Neu. Denoising in digital speckle pattern interferometry by Riesz wavelets | Abdelkrim Nassim (u. a.) | Taschenbuch | Englisch | 2018 | LAP LAMBERT Academic Publishing | EAN 9786139873821 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.
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Digital Shearography : Theory and Application of Digital Speckle Pattern Shearing Interferometry
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Condition: Sehr gut. Zustand: Sehr gut | Seiten: 384 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Digital Speckle Pattern Interferometry & Related Techniques
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 420.44
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Digital Speckle Pattern Interferometry and Related Techniques
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
First Edition
Condition: New. The instructive nature of this volume should make it an excellent text for engineers and physicists. Extended bibliographies serve as an excellent source of information for those wanting to go into greater depth on a specific topic. Editor(s): Rastogi, Pramod. Num Pages: 384 pages, bibliographies. BIC Classification: PH; TBC; TTB. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 233 x 162 x 36. Weight in Grams: 732. . 2000. 1st Edition. hardcover. . . . .
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Condition: New. this book is a welcome addition to the speckle pattern interferometry literature. The book is an excellent value for any graduate student, application engineer, research laboratory and group working in this field. Reading this book is a very enjoyable expe.
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Condition: New. The instructive nature of this volume should make it an excellent text for engineers and physicists. Extended bibliographies serve as an excellent source of information for those wanting to go into greater depth on a specific topic. Editor(s): Rastogi, Pramod. Num Pages: 384 pages, bibliographies. BIC Classification: PH; TBC; TTB. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 233 x 162 x 36. Weight in Grams: 732. . 2000. 1st Edition. hardcover. . . . . Books ship from the US and Ireland.
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Digital Speckle Pattern Interferometry
Language: English
Published by John Wiley & Sons Feb 2001, 2001
ISBN 10: 0471490520 ISBN 13: 9780471490524
Buch. Condition: Neu. Neuware - Ein modernes Buch für Ingenieure und Physiker! Theorie, Anwendung, Auswertung und spezielle Aspekte der Speckle-Interferometrie werden ausführlich erläutert. Eine umfangreiche Bibliographie erleichtert den Zugang zur weiterführenden Literatur. (11/00).
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Digital Speckle Pattern Interferometry and Related Techniques
Language: English
Published by John Wiley & Sons Inc, 2001
ISBN 10: 0471490520 ISBN 13: 9780471490524
Hardcover. Condition: Brand New. 1st edition. 368 pages. 9.50x6.25x1.00 inches. In Stock.
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Denoising in digital speckle pattern interferometry by Riesz wavelets
Language: English
Published by LAP LAMBERT Academic Publishing Jul 2018, 2018
ISBN 10: 6139873827 ISBN 13: 9786139873821
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Over the years, optical measurement techniques have been the problem-solving backbone of many engineering applications such as nondestructive testing of materials, measurement of various material properties, structural analysis, and experimental mechanics. Digital speckle pattern interferometry gives these measurements with high accuracy. The main challenges in speckle interferometry manifest on phase mapping estimation, leading to the direct determination of the measurement. Furthermore, fringes correlation are characterized by a strong speckle noise defined as a granular structure resulting from self-interference of coherent waves randomly scattered from a rough surface, making it capable of giving the measurement of physical magnitude with an accuracy of the order of wavelength used. For this reason, several papers are published annually in the speckle noise reduction domain. 56 pp. Englisch.
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Denoising in digital speckle pattern interferometry by Riesz wavelets
Language: English
Published by LAP LAMBERT Academic Publishing Jul 2018, 2018
ISBN 10: 6139873827 ISBN 13: 9786139873821
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Over the years, optical measurement techniques have been the problem-solving backbone of many engineering applications such as nondestructive testing of materials, measurement of various material properties, structural analysis, and experimental mechanics. Digital speckle pattern interferometry gives these measurements with high accuracy. The main challenges in speckle interferometry manifest on phase mapping estimation, leading to the direct determination of the measurement. Furthermore, fringes correlation are characterized by a strong speckle noise defined as a granular structure resulting from self-interference of coherent waves randomly scattered from a rough surface, making it capable of giving the measurement of physical magnitude with an accuracy of the order of wavelength used. For this reason, several papers are published annually in the speckle noise reduction domain.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 56 pp. Englisch.
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Denoising in digital speckle pattern interferometry by Riesz wavelets
Language: English
Published by LAP LAMBERT Academic Publishing, 2018
ISBN 10: 6139873827 ISBN 13: 9786139873821
Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Over the years, optical measurement techniques have been the problem-solving backbone of many engineering applications such as nondestructive testing of materials, measurement of various material properties, structural analysis, and experimental mechanics. Digital speckle pattern interferometry gives these measurements with high accuracy. The main challenges in speckle interferometry manifest on phase mapping estimation, leading to the direct determination of the measurement. Furthermore, fringes correlation are characterized by a strong speckle noise defined as a granular structure resulting from self-interference of coherent waves randomly scattered from a rough surface, making it capable of giving the measurement of physical magnitude with an accuracy of the order of wavelength used. For this reason, several papers are published annually in the speckle noise reduction domain.
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Digital Speckle Pattern Interferometry and Related Techniques
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
£ 418.93
£ 5.87 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHRD. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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Digital Speckle Pattern Interferometry and Related Techniques (Hardcover)
Language: English
Published by John Wiley & Sons Inc, New York, 2000
ISBN 10: 0471490520 ISBN 13: 9780471490524
First Edition Print on Demand
Hardcover. Condition: new. Hardcover. Digital Speckle Interferometry and Related Techniques provides a single source of information in this rapidly progressing field. Containing contributions from leading experts, it provides the key background information, including the fundamental concepts, techniques, and applications, and presents the major technological progress that has contributed to revitalization in the field over the past fifteen years, including digital speckle photography and digital holographic interferometry. The instructive nature of this volume should make it an excellent text for engineers and physicists. Extended bibliographies serve as an excellent source of information for those wanting to go into greater depth on a specific topic. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
