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Published by VDM Verlag Dr. Müller, 2008
ISBN 10: 3639096762 ISBN 13: 9783639096767
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Published by VDM Verlag Dr. Müller, 2008
ISBN 10: 3639096762 ISBN 13: 9783639096767
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Published by VDM Verlag Dr. Müller, 2008
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Published by VDM Verlag Dr. Mïż½ller 2008-11-26, 2008
ISBN 10: 3639096762 ISBN 13: 9783639096767
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Published by VDM Verlag Dr. Müller, 2008
ISBN 10: 3639096762 ISBN 13: 9783639096767
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Published by VDM Verlag Dr. Müller, 2008
ISBN 10: 3639096762 ISBN 13: 9783639096767
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Published by VDM Verlag Dr. Müller, 2008
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Taschenbuch. Condition: Neu. Advanced Packaging For Microelectronic and Microsystem Applications | With Emphasis on GaN Technology | Travis Anderson | Taschenbuch | Kartoniert / Broschiert | Englisch | 2008 | VDM Verlag Dr. Müller | EAN 9783639096767 | Verantwortliche Person für die EU: OmniScriptum GmbH & Co. KG, Bahnhofstr. 28, 66111 Saarbrücken, info[at]akademikerverlag[dot]de | Anbieter: preigu.
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Published by VDM Verlag Dr. Müller, 2008
ISBN 10: 3639096762 ISBN 13: 9783639096767
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Published by VDM Verlag Dr. Müller, 2008
ISBN 10: 3639096762 ISBN 13: 9783639096767
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Published by VDM Verlag Dr. Müller, 2008
ISBN 10: 3639096762 ISBN 13: 9783639096767
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Published by VDM Verlag Dr. Müller, 2008
ISBN 10: 3639096762 ISBN 13: 9783639096767
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Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The emergence of GaN-based devices promises arevolution in areas requiring high performanceelectronics, such as high speed earth and space-basedcommunication systems, advanced radar, integratedsensors, high temperature electronics, and utilitypower switching. The properties of this system makeit ideally suited for operation at elevatedtemperatures and at voltage and current levels wellbeyond that accessible by Si. Recent improvements inmaterial quality and device performance are rapidlyopening the door to commercialization, and III-Ntechnologies are demonstrating exciting developmentsof late. Though devices are enteringcommercialization, there are still considerableunknowns, particularly in the reliability field.Recent advances at the University of Florida will bedetailed in this work.