9798337344607 - Automating Software Defect Detection Through Machine Learning and Llms (5 results)

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  • Language: English

    Published by IGI Global, 2025

    9798337344607

    • Hardcover

    Seller: PBShop.store US, Wood Dale, IL, U.S.A.PBShop.store US

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    £ 217.50

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    HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.

  • Language: English

    Published by IGI Global, 2025

    9798337344607

    • Hardcover

    Seller: PBShop.store UK, Fairford, GLOS, United KingdomPBShop.store UK

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    £ 202.92

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    HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.

  • Language: English

    Published by IGI Global, Hershey, PA, 2025

    9798337344607

    • Hardcover
    • Print on Demand

    Seller: CitiRetail, Stevenage, United KingdomCitiRetail

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    Hardcover. Condition: new. Hardcover. As software systems grow in complexity and scale, ensuring their reliability and quality becomes challenging. Traditional methods of defect detection are time-consuming, prone to errors, and inadequate for identifying issues. To address these limitations, the integration of machine learning

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    Language: English

    Published by IGI Global, 2025

    9798337344607

    • Hardcover
    • Print on Demand

    Seller: preigu, Osnabrück, Germanypreigu

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    £ 264.29

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    Buch. Condition: Neu. Automating Software Defect Detection Through Machine Learning and LLMs | Bryan Gardiner (u. a.) | Buch | Englisch | 2025 | IGI Global | EAN 9798337344607 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand.

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    Language: English

    Published by IGI Global, 2025

    9798337344607

    • Hardcover
    • Print on Demand

    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    £ 339.83

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    Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - As software systems grow in complexity and scale, ensuring their reliability and quality becomes challenging. Traditional methods of defect detection are time-consuming, prone to errors, and inadequate for identifying issues. To address these l