Isbn: 9781441925800 - Evolution of Thin Film Morphology: Modeling and Simulations: 108 (springer Series in Materials Science, 108) (11 results)

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  • Language: English

    Published by Springer, 2010

    1441925805 / 9781441925800

    Series: Book 16 of 233 - Springer Series in Materials Science

    • Softcover

    Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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    Condition: New. In English.

  • Language: English

    Published by Springer, 2010

    1441925805 / 9781441925800

    Series: Book 16 of 233 - Springer Series in Materials Science

    • Softcover

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    Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Thin lmdepositionisthemostubiquitousandcriticaloftheprocessesusedto manufacture high-tech devices such as microprocessors, memories, solar cells, microelectromechanicalsystems(MEMS),lasers,solid-statelighting,andp- tovoltaics. The morphology and microstructure of thin lms directly controls their optical, magnetic, and electrical properties, which are often signi cantly di erent from bulk material properties. Precise control of morphology and microstructure during thin lm growth is paramount to producing the - sired lm quality for speci c applications. To date, many thin lm deposition techniques have been employed for manufacturing lms, including thermal evaporation,sputterdeposition,chemicalvapordeposition,laserablation,and electrochemical deposition. The growth of lms using these techniques often occurs under highly n- equilibrium conditions (sometimes referred to as far-from-equilibrium), which leads to a rough surface morphology and a complex temporal evolution. As atoms are deposited on a surface, atoms do not arrive at the surface at the same time uniformly across the surface. This random uctuation, or noise, which is inherent to the deposition process, may create surface growth front roughness. The noise competes with surface smoothing processes, such as surface di usion, to form a rough morphology if the experiment is performed at a su ciently low temperature and / or at a high growth rate. In addition, growth front roughness can also be enhanced by growth processes such as geometrical shadowing. Due to the nature of the deposition process, atoms approaching the surface do not always approach in parallel; very often atoms arrive at the surface with an angular distribution. …

  • Language: English

    Published by Springer, 2010

    1441925805 / 9781441925800

    Series: Book 16 of 233 - Springer Series in Materials Science

    • Softcover

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    Condition: New. pp. 220.

  • Language: English

    Published by Springer, 2007

    1441925805 / 9781441925800

    Series: Book 16 of 233 - Springer Series in Materials Science

    • Softcover

    Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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    Paperback. Condition: Brand New. 220 pages. 9.10x6.10x0.70 inches. In Stock.

  • Language: English

    Published by Springer, 2010

    1441925805 / 9781441925800

    Series: Book 16 of 233 - Springer Series in Materials Science

    • Softcover

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  • Language: English

    Published by Springer, 2010

    1441925805 / 9781441925800

    Series: Book 16 of 233 - Springer Series in Materials Science

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    Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand

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  • Language: English

    Published by Springer New York Nov 2010, 2010

    1441925805 / 9781441925800

    Series: Book 16 of 233 - Springer Series in Materials Science

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    Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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    Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The focus of this book is on modeling and simulations used in research on the morphological evolution during film growth. The authors emphasize the detailed mathematical formulation of the problem. The book will enable readers themselves to set up a computational program to investigate specific topics of interest in thin film deposition. It will benefit those working in any discipline that requires an understanding of thin film growth processes. 220 pp. Englisch.…

  • Language: English

    Published by Springer New York, 2010

    1441925805 / 9781441925800

    Series: Book 16 of 233 - Springer Series in Materials Science

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents basic modeling and simulation tools for quantitative description of thin film morphological evolutionDisplays clear conceptual developments in the fundamental understanding of complex surface growth phenomenaProvides a close connec.…

  • Language: English

    Published by Springer New York, Springer US Nov 2010, 2010

    1441925805 / 9781441925800

    Series: Book 16 of 233 - Springer Series in Materials Science

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    Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000

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    Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Thin lmdepositionisthemostubiquitousandcriticaloftheprocessesusedto manufacture high-tech devices such as microprocessors, memories, solar cells, microelectromechanicalsystems(MEMS),lasers,solid-statelighting,andp- tovoltaics. The morphology and microstructure of thin lms directly controls their optical, magnetic, and electrical properties, which are often signi cantly di erent from bulk material properties. Precise control of morphology and microstructure during thin lm growth is paramount to producing the - sired lm quality for speci c applications. To date, many thin lm deposition techniques have been employed for manufacturing lms, including thermal evaporation,sputterdeposition,chemicalvapordeposition,laserablation,and electrochemical deposition. The growth of lms using these techniques often occurs under highly n- equilibrium conditions (sometimes referred to as far-from-equilibrium), which leads to a rough surface morphology and a complex temporal evolution. As atoms are deposited on a surface, atoms do not arrive at the surface at the same time uniformly across the surface. This random uctuation, or noise, which is inherent to the deposition process, may create surface growth front roughness. The noise competes with surface smoothing processes, such as surface di usion, to form a rough morphology if the experiment is performed at a su ciently low temperature and / or at a high growth rate. In addition, growth front roughness can also be enhanced by growth processes such as geometrical shadowing. Due to the nature of the deposition process, atoms approaching the surface do not always approach in parallel; very often atoms arrive at the surface with an angular distribution.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 220 pp. Englisch. …

  • Language: English

    Published by Springer, 2010

    1441925805 / 9781441925800

    Series: Book 16 of 233 - Springer Series in Materials Science

    • Softcover
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    Condition: New. Print on Demand pp. 220 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

  • Language: English

    Published by Springer, 2010

    1441925805 / 9781441925800

    Series: Book 16 of 233 - Springer Series in Materials Science

    • Softcover
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    Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

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    Condition: New. PRINT ON DEMAND pp. 220.