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Evolution of Thin Film Morphology: Modeling and Simulations: 108 (Springer Series in Materials Science, 108) - Softcover
Book 15 of 233: Springer Series in Materials Science
Synopsis
Thin film deposition is the most ubiquitous and critical of the processes used to manufacture high tech devices. Morphology and microstructure of thin films directly controls their optical, magnetic, and electrical properties. This book focuses on modeling and simulations used in research on the morphological evolution during film growth. The authors emphasize the detailed mathematical formulation of the problem both through numerical calculations based on Langevin continuum equations, and through Monte Carlo simulations based on discrete surface growth models when an analytical formulism is not convenient. Evolution of Thin-Film Morphology will be of benefit to university researchers and industrial scientists working in the areas of semiconductor processing, optical coating, plasma etching, patterning, micro-machining, polishing, tribology, and any discipline that requires an understanding of thin film growth processes. In particular, the reader will be introduced to the mathematical tools that are available to describe such a complex problem, and appreciate the utility of the various modeling methods through numerous example discussions. For beginners in the field, the text is written assuming a minimal background in mathematics and computer programming. The book will enable readers themselves to set up a computational program to investigate specific topics of interest in thin film deposition.
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From the Back Cover
Thin film deposition is the most ubiquitous and critical of the processes used to manufacture high tech devices. Morphology and microstructure of thin films directly controls their optical, magnetic, and electrical properties. This book focuses on modeling and simulations used in research on the morphological evolution during film growth. The authors emphasize the detailed mathematical formulation of the problem both through numerical calculations based on Langevin continuum equations, and through Monte Carlo simulations based on discrete surface growth models when an analytical formulism is not convenient. Evolution of Thin-Film Morphology will be of benefit to university researchers and industrial scientists working in the areas of semiconductor processing, optical coating, plasma etching, patterning, micro-machining, polishing, tribology, and any discipline that requires an understanding of thin film growth processes. In particular, the reader will be introduced to the mathematical tools that are available to describe such a complex problem, and appreciate the utility of the various modeling methods through numerous example discussions. For beginners in the field, the text is written assuming a minimal background in mathematics and computer programming. The book will enable readers themselves to set up a computational program to investigate specific topics of interest in thin film deposition.
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Evolution of Thin Film Morphology (eng)
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Evolution of Thin Film Morphology
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The focus of this book is on modeling and simulations used in research on the morphological evolution during film growth. The authors emphasize the detailed mathematical formulation of the problem. The book will enable readers themselves to set up a computational program to investigate specific topics of interest in thin film deposition. It will benefit those working in any discipline that requires an understanding of thin film growth processes. 220 pp. Englisch. Seller Inventory # 9781441925800
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Evolution of Thin Film Morphology: Modeling and Simulations (Springer Series in Materials Science, 108)
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Evolution of Thin Film Morphology
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents basic modeling and simulation tools for quantitative description of thin film morphological evolutionDisplays clear conceptual developments in the fundamental understanding of complex surface growth phenomenaProvides a close connec. Seller Inventory # 4173089
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Evolution of Thin Film Morphology : Modeling and Simulations
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Thin lmdepositionisthemostubiquitousandcriticaloftheprocessesusedto manufacture high-tech devices such as microprocessors, memories, solar cells, microelectromechanicalsystems(MEMS),lasers,solid-statelighting,andp- tovoltaics. The morphology and microstructure of thin lms directly controls their optical, magnetic, and electrical properties, which are often signi cantly di erent from bulk material properties. Precise control of morphology and microstructure during thin lm growth is paramount to producing the - sired lm quality for speci c applications. To date, many thin lm deposition techniques have been employed for manufacturing lms, including thermal evaporation,sputterdeposition,chemicalvapordeposition,laserablati on,and electrochemical deposition. The growth of lms using these techniques often occurs under highly n- equilibrium conditions (sometimes referred to as far-from-equilibrium), which leads to a rough surface morphology and a complex temporal evolution. As atoms are deposited on a surface, atoms do not arrive at the surface at the same time uniformly across the surface. This random uctuation, or noise, which is inherent to the deposition process, may create surface growth front roughness. The noise competes with surface smoothing processes, such as surface di usion, to form a rough morphology if the experiment is performed at a su ciently low temperature and / or at a high growth rate. In addition, growth front roughness can also be enhanced by growth processes such as geometrical shadowing. Due to the nature of the deposition process, atoms approaching the surface do not always approach in parallel; very often atoms arrive at the surface with an angular distribution. Seller Inventory # 9781441925800
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Evolution of Thin Film Morphology
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Springer New York, Springer US Nov 2010, 2010
ISBN 10: 1441925805
ISBN 13: 9781441925800
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Thin lmdepositionisthemostubiquitousandcriticaloftheprocessesusedto manufacture high-tech devices such as microprocessors, memories, solar cells, microelectromechanicalsystems(MEMS),lasers,solid-statelighting,andp- tovoltaics. The morphology and microstructure of thin lms directly controls their optical, magnetic, and electrical properties, which are often signi cantly di erent from bulk material properties. Precise control of morphology and microstructure during thin lm growth is paramount to producing the - sired lm quality for speci c applications. To date, many thin lm deposition techniques have been employed for manufacturing lms, including thermal evaporation,sputterdeposition,chemicalvapordeposition,laserablation,and electrochemical deposition. The growth of lms using these techniques often occurs under highly n- equilibrium conditions (sometimes referred to as far-from-equilibrium), which leads to a rough surface morphology and a complex temporal evolution. As atoms are deposited on a surface, atoms do not arrive at the surface at the same time uniformly across the surface. This random uctuation, or noise, which is inherent to the deposition process, may create surface growth front roughness. The noise competes with surface smoothing processes, such as surface di usion, to form a rough morphology if the experiment is performed at a su ciently low temperature and / or at a high growth rate. In addition, growth front roughness can also be enhanced by growth processes such as geometrical shadowing. Due to the nature of the deposition process, atoms approaching the surface do not always approach in parallel; very often atoms arrive at the surface with an angular distribution.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 220 pp. Englisch. Seller Inventory # 9781441925800
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Evolution of Thin Film Morphology
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Evolution of Thin Film Morphology: Modeling and Simulations (Springer Series in Materials Science)
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Evolution of Thin Film Morphology
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