Isbn: 9780792393528 - Hot-carrier Reliability of Mos Vlsi Circuits: 227 (the Springer International Series in Engineering and Computer Science, 227) (8 results)

- Hardcover
Seller: California Books, Miami, FL, U.S.A.California Books
Contact seller4-star sellerCondition: New
£ 198.80
Free ShippingShips within U.S.A.Quantity: Over 20 available
Condition: New.

- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 189.04
£ 11.29 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In English.

- Hardcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.
Contact seller5-star sellerCondition: New
£ 225.63
£ 8.14 shippingShips from Ireland to U.S.A.Quantity: 15 available
Condition: New. Addresses the issues related to hot-carrier reliability of MOS VLSI circuits.This book is primarily for use by engineers and scientists who study device and circuit-level reliability in VLSI systems and develop practical reliability measures and models. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 212 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 14. Weight in Grams: 509. . 1993. Hardback. . . . .…

- Hardcover
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
£ 217.81
£ 41.96 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Gebunden. Condition: New. As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be.

- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
£ 265.36
£ 2.96 shippingShips within U.S.A.Quantity: 4 available
Condition: New. pp. 236.

- Hardcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
Contact seller5-star sellerCondition: New
£ 275.20
£ 7.79 shippingShips within U.S.A.Quantity: 15 available
Condition: New. Addresses the issues related to hot-carrier reliability of MOS VLSI circuits.This book is primarily for use by engineers and scientists who study device and circuit-level reliability in VLSI systems and develop practical reliability measures and models. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 212 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 14. Weight in Grams: 509. . 1993. Hardback. . . . . Books ship from the US and Ireland.…

- Hardcover
- Print on Demand
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
Contact seller4-star sellerCondition: New
£ 278.24
£ 6.50 shippingShips from United Kingdom to U.S.A.Quantity: 4 available
Condition: New. Print on Demand pp. 236 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.

- Hardcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
Contact seller4-star sellerCondition: New
£ 291.63
£ 8.52 shippingShips from Germany to U.S.A.Quantity: 4 available
Condition: New. PRINT ON DEMAND pp. 236.