Hot-Carrier Reliability of MOS VLSI Circuits

Language: English

Published by Springer US, 1993

079239352X / 9780792393528

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Seller: moluna, Greven, Germanymoluna

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As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be.

Seller Inventory # 5971429

Title
Hot-Carrier Reliability of MOS VLSI Circuits
Author
Yusuf Leblebici|Sung-Mo (Steve) Kang
Publisher
Springer US
Publication year
1993
Condition
New
Binding
Gebunden
Language
English
ISBN 10
079239352X
ISBN 13
9780792393528

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

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