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9780442002213 - Designer's Guide to Testable Asic Devices by Needham, Wayne M (13 results)
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Designer's Guide to Testable ASIC Devices
Language: English
Published by Van Nostrand Reinhold Company, 1991
ISBN 10: 0442002211 ISBN 13: 9780442002213
Condition: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy. Dust jacket in fair condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,700grams, ISBN:9780442002213.
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Designer's Guide to Testable Asic Devices
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 137.84
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: New.
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Designer's Guide to Testable Asic Devices
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 137.83
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Designer's Guide to Testable A.S.I.C. Devices
Language: English
Published by Kluwer Academic Publishers Group, 1991
ISBN 10: 0442002211 ISBN 13: 9780442002213
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact o Num Pages: 298 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 235 x 155 x 20. Weight in Grams: 607. . 1991. Hardback. . . . .
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Designer's Guide to Testable Asic Devices
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 176.99
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: As New. Unread book in perfect condition.
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Gebunden. Condition: New. KlappentextWhile making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows reade.
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Designer's Guide to Testable A.S.I.C. Devices
Language: English
Published by Kluwer Academic Publishers Group, 1991
ISBN 10: 0442002211 ISBN 13: 9780442002213
Condition: New. While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact o Num Pages: 298 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 235 x 155 x 20. Weight in Grams: 607. . 1991. Hardback. . . . . Books ship from the US and Ireland.
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Designer's Guide to Testable ASIC Devices
Language: English
Published by Springer Us Jan 1991, 1991
ISBN 10: 0442002211 ISBN 13: 9780442002213
Buch. Condition: Neu. Neuware - While making up a larger percentage of the total number of designs produced each year, ASICs present special problems for system designers in the area of testing because each design is complex and unique. This book shows readers how to apply basic test techniques to ASIC design, details the impact o.
