9780367707170 - Radiation Detection Systems: Sensor Materials, Systems, Technology, and Characterization Measurements (devices, Circuits, and Systems) (24 results)

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  • Language: English

    Published by CRC Press, 2024

    0367707179 / 9780367707170

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  • Language: English

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  • Language: English

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  • Language: English

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  • Language: English

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  • Language: English

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  • Language: English

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    Condition: New. Second edition Includes bibliographical references and index.

  • Language: English

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  • Language: English

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  • Language: English

    Published by CRC Press, 2024

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    Published by Taylor & Francis Ltd, 2024

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    Published by CRC Press, 2024

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  • Language: English

    Published by Taylor & Francis Ltd, 2024

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    Paperback. Condition: Brand New. 323 pages. 6.14x0.72x9.21 inches. In Stock.

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    Language: English

    Published by CRC Press, 2024

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    Taschenbuch. Condition: Neu. Radiation Detection Systems | Sensor Materials, Systems, Technology, and Characterization Measurements | Krzysztof Iniewski (u. a.) | Taschenbuch | Englisch | 2024 | CRC Press | EAN 9780367707170 | Verantwortliche Person für die EU: Taylor & Francis Verlag GmbH, Kaufingerstr. 24, 80331 München, gpsr[

  • Language: English

    Published by CRC Press, 2024

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  • Language: English

    Published by CRC Press, 2024

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    Condition: Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days. Excellent Customer Service.

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    Published by CRC Press, 2024

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    PAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

  • Language: English

    Published by CRC Press, 2024

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    Published by CRC Press Mai 2024, 2024

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    Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The advances in semiconductor detectors, scintillators, photodetectors such as silicon photomultipliers (SiPM), and reaodut electronics have experienced tremendous growth in recent years in terms of basic technologies and variety of

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    Published by Taylor & Francis Ltd, 2024

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    Published by CRC Press, 2024

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Jan Iwanczyk is a consultant to Universities and private companies since July 2017. He has served as a President and CEO of DxRay, Inc., Northridge, California, from 2005 to 2017.Krzysztof (Kris) Iniewski is manag.

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    Language: English

    Published by CRC Press, 2024

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    Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The advances in semiconductor detectors, scintillators, photodetectors such as silicon photomultipliers (SiPM), and reaodut electronics have experienced tremendous growth in recent years in terms of basic technologies and variety of appl