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Advanced MOS Devices and their Circuit Applications
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Energy Efficient and Reliable Embedded Nanoscale Sram Design
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Advanced MOS Devices and their Circuit Applications
Language: English
Published by Taylor & Francis Ltd, 2025
ISBN 10: 1032670266 ISBN 13: 9781032670263
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Advanced Mos Devices and Their Circuit Applications
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Energy Efficient and Reliable Embedded Nanoscale Sram Design
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Advanced Mos Devices and Their Circuit Applications
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Energy Efficient and Reliable Embedded Nanoscale SRAM Design
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Advanced MOS Devices and their Circuit Applications
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VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers (Communications in Computer and Information Science, 1066)
Book 284 of 578: Communications in Computer and Information ScienceSeller: Ria Christie Collections, Uxbridge, United Kingdom
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VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4ż6, 2019, Revised Selected Papers
Book 284 of 578: Communications in Computer and Information ScienceLanguage: English
Published by Springer Nature Singapore, 2019
ISBN 10: 9813297662 ISBN 13: 9789813297661
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 792 | Sprache: Englisch | Produktart: Bücher | This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
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VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4ż6, 2019, Revised Selected Papers
Book 284 of 578: Communications in Computer and Information ScienceLanguage: English
Published by Springer Nature Singapore, 2019
ISBN 10: 9813297662 ISBN 13: 9789813297661
Condition: Gut. Zustand: Gut | Seiten: 792 | Sprache: Englisch | Produktart: Bücher | This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
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