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Tehranipoor Mohammad Peng Chakrabarty Krishnendu (19 results)
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Testing and Diagnosis for Small-Delay Defects.
Published by New York, Springer New York., 2011
ISBN 10: 1441982965 ISBN 13: 9781441982964
Language: English
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 5 out of 5 stars
£ 14.24
Convert currency£ 10.37 shipping from Germany to United KingdomQuantity: 1 available
Add to basketXVIII, 212 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Sprache: Englisch.
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Paperback. Condition: New.
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Test and Diagnosis for Small-Delay Defects
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 92.42
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£ 87.84
Convert currency£ 14.73 shipping from U.S.A. to United KingdomQuantity: Over 20 available
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Test and Diagnosis for Small-Delay Defects
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 101.85
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£ 83.03
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Test and Diagnosis for Small-Delay Defects
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 106.93
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Add to basketCondition: As New. Unread book in perfect condition.
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£ 104.48
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£ 98.06
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Test and Diagnosis for Small-Delay Defects
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 128.82
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Hardcover. Condition: Brand New. 212 pages. 9.25x6.25x0.50 inches. In Stock.
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£ 136.99
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Add to basketCondition: New. pp. 232.
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£ 88.34
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£ 103.75
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Paperback. Condition: Like New. Like New. book.
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£ 80.12
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Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects Presents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and.
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£ 89.37
Convert currency£ 21.60 shipping from Germany to United KingdomQuantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects Presents the most effective techniques for screening small-delay defects, such as long path-based, slack-based, critical fault-based, and.
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Condition: New. Print on Demand pp. 232.
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£ 151.82
Convert currency£ 6.87 shipping from Germany to United KingdomQuantity: 4 available
Add to basketCondition: New. PRINT ON DEMAND pp. 232.
