Stallinga Professor Peter (13 results)

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  • Language: English

    Published by Wiley, 2009

    047075009X / 9780470750094

    • Hardcover

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  • Language: English

    Published by Wiley, 2009

    047075009X / 9780470750094

    • Hardcover

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  • Language: English

    Published by Wiley, 2009

    047075009X / 9780470750094

    • Hardcover

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    Condition: New. In English.

  • Language: English

    Published by John Wiley & Sons Inc, New York, 2009

    047075009X / 9780470750094

    • Hardcover
    • First Edition

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    Hardcover. Condition: new. Hardcover. Think like an electron Organic electronic materials have many applications and potential in low-cost electronics such as electronic barcodes and in light emitting devices, due to their easily tailored properties. While the chemical aspects and characterization have been widely studied, characterization of the electrical properties has been neglected, and classic textbook modeling has been applied. This is most striking in the analysis of thin-film transistors (TFTs) using thick bulk transistor (MOS-FET) descriptions. At first glance the TFTs appear to behave as regular MOS-FETs. However, upon closer examination it is clear that TFTs are unique and merit their own model. Understanding and interpreting measurements of organic devices, which are often seen as black-box measurements, is critical to developing better devices and this, therefore, has to be done with care. Electrical Characterization of Organic Electronic Materials and Devices Gives new insights into the electronic properties and measurement techniques for low-mobility electronic devicesCharacterizes the thin-film transistor using its own modelLinks the phenomena seen in different device structures and different measurement techniquesPresents clearly both how to perform electrical measurements of organic and low-mobility materials and how to extract important information from these measurementsProvides a much-needed theoretical foundation for organic electronics Offers fresh insights into the electronic properties and measurement techniques for low-mobility electronic devices and characterizes the thin-film transistor using its own model. This title links the phenomena seen in different device structures and different measurement techniques. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

  • Language: English

    Published by John Wiley and Sons Inc, US, 2009

    047075009X / 9780470750094

    • Hardcover

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    Hardback. Condition: New. Think like an electron Organic electronic materials have many applications and potential in low-cost electronics such as electronic barcodes and in light emitting devices, due to their easily tailored properties. While the chemical aspects and characterization have been widely studied, characterization of the electrical properties has been neglected, and classic textbook modeling has been applied. This is most striking in the analysis of thin-film transistors (TFTs) using thick "bulk" transistor (MOS-FET) descriptions. At first glance the TFTs appear to behave as regular MOS-FETs. However, upon closer examination it is clear that TFTs are unique and merit their own model. Understanding and interpreting measurements of organic devices, which are often seen as black-box measurements, is critical to developing better devices and this, therefore, has to be done with care. Electrical Characterization of Organic Electronic Materials and Devices Gives new insights into the electronic properties and measurement techniques for low-mobility electronic devicesCharacterizes the thin-film transistor using its own modelLinks the phenomena seen in different device structures and different measurement techniquesPresents clearly both how to perform electrical measurements of organic and low-mobility materials and how to extract important information from these measurementsProvides a much-needed theoretical foundation for organic electronics.

  • Language: English

    Published by John Wiley and Sons Inc, US, 2009

    047075009X / 9780470750094

    • Hardcover

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    Hardback. Condition: New. Think like an electron Organic electronic materials have many applications and potential in low-cost electronics such as electronic barcodes and in light emitting devices, due to their easily tailored properties. While the chemical aspects and characterization have been widely studied, characterization of the electrical properties has been neglected, and classic textbook modeling has been applied. This is most striking in the analysis of thin-film transistors (TFTs) using thick "bulk" transistor (MOS-FET) descriptions. At first glance the TFTs appear to behave as regular MOS-FETs. However, upon closer examination it is clear that TFTs are unique and merit their own model. Understanding and interpreting measurements of organic devices, which are often seen as black-box measurements, is critical to developing better devices and this, therefore, has to be done with care. Electrical Characterization of Organic Electronic Materials and Devices Gives new insights into the electronic properties and measurement techniques for low-mobility electronic devicesCharacterizes the thin-film transistor using its own modelLinks the phenomena seen in different device structures and different measurement techniquesPresents clearly both how to perform electrical measurements of organic and low-mobility materials and how to extract important information from these measurementsProvides a much-needed theoretical foundation for organic electronics.

  • Language: English

    Published by WileyBlackwell, 2009

    047075009X / 9780470750094

    • Hardcover

    Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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    Hardcover. Condition: Brand New. 1st edition. 316 pages. 9.21x6.14x0.87 inches. In Stock.

  • Language: English

    Published by John Wiley & Sons Inc, New York, 2009

    047075009X / 9780470750094

    • Hardcover
    • First Edition

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    Hardcover. Condition: new. Hardcover. Think like an electron Organic electronic materials have many applications and potential in low-cost electronics such as electronic barcodes and in light emitting devices, due to their easily tailored properties. While the chemical aspects and characterization have been widely studied, characterization of the electrical properties has been neglected, and classic textbook modeling has been applied. This is most striking in the analysis of thin-film transistors (TFTs) using thick bulk transistor (MOS-FET) descriptions. At first glance the TFTs appear to behave as regular MOS-FETs. However, upon closer examination it is clear that TFTs are unique and merit their own model. Understanding and interpreting measurements of organic devices, which are often seen as black-box measurements, is critical to developing better devices and this, therefore, has to be done with care. Electrical Characterization of Organic Electronic Materials and Devices Gives new insights into the electronic properties and measurement techniques for low-mobility electronic devicesCharacterizes the thin-film transistor using its own modelLinks the phenomena seen in different device structures and different measurement techniquesPresents clearly both how to perform electrical measurements of organic and low-mobility materials and how to extract important information from these measurementsProvides a much-needed theoretical foundation for organic electronics Offers fresh insights into the electronic properties and measurement techniques for low-mobility electronic devices and characterizes the thin-film transistor using its own model. This title links the phenomena seen in different device structures and different measurement techniques. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.

  • Language: English

    Published by Wiley, 2009

    047075009X / 9780470750094

    • Hardcover
    • First Edition

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    Condition: New. Offers fresh insights into the electronic properties and measurement techniques for low-mobility electronic devices and characterizes the thin-film transistor using its own model. This title links the phenomena seen in different device structures and different measurement techniques. Num Pages: 316 pages, Illustrations. BIC Classification: TG; TJ. Category: (P) Professional & Vocational. Dimension: 237 x 161 x 23. Weight in Grams: 590. . 2009. 1st Edition. hardcover. . . . .

  • Language: English

    Published by John Wiley and Sons Inc, US, 2009

    047075009X / 9780470750094

    • Hardcover

    Seller: Rarewaves USA United, HEBRON, KY, U.S.A.Rarewaves USA United

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    Hardback. Condition: New. Think like an electron Organic electronic materials have many applications and potential in low-cost electronics such as electronic barcodes and in light emitting devices, due to their easily tailored properties. While the chemical aspects and characterization have been widely studied, characterization of the electrical properties has been neglected, and classic textbook modeling has been applied. This is most striking in the analysis of thin-film transistors (TFTs) using thick "bulk" transistor (MOS-FET) descriptions. At first glance the TFTs appear to behave as regular MOS-FETs. However, upon closer examination it is clear that TFTs are unique and merit their own model. Understanding and interpreting measurements of organic devices, which are often seen as black-box measurements, is critical to developing better devices and this, therefore, has to be done with care. Electrical Characterization of Organic Electronic Materials and Devices Gives new insights into the electronic properties and measurement techniques for low-mobility electronic devicesCharacterizes the thin-film transistor using its own modelLinks the phenomena seen in different device structures and different measurement techniquesPresents clearly both how to perform electrical measurements of organic and low-mobility materials and how to extract important information from these measurementsProvides a much-needed theoretical foundation for organic electronics.

  • Language: English

    Published by Wiley, 2009

    047075009X / 9780470750094

    • Hardcover

    Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore

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    Condition: New. Offers fresh insights into the electronic properties and measurement techniques for low-mobility electronic devices and characterizes the thin-film transistor using its own model. This title links the phenomena seen in different device structures and different measurement techniques. Num Pages: 316 pages, Illustrations. BIC Classification: TG; TJ. Category: (P) Professional & Vocational. Dimension: 237 x 161 x 23. Weight in Grams: 590. . 2009. 1st Edition. hardcover. . . . . Books ship from the US and Ireland.

  • Language: English

    Published by John Wiley and Sons Inc, US, 2009

    047075009X / 9780470750094

    • Hardcover

    Seller: Rarewaves.com UK, London, United KingdomRarewaves.com UK

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    Hardback. Condition: New. Think like an electron Organic electronic materials have many applications and potential in low-cost electronics such as electronic barcodes and in light emitting devices, due to their easily tailored properties. While the chemical aspects and characterization have been widely studied, characterization of the electrical properties has been neglected, and classic textbook modeling has been applied. This is most striking in the analysis of thin-film transistors (TFTs) using thick "bulk" transistor (MOS-FET) descriptions. At first glance the TFTs appear to behave as regular MOS-FETs. However, upon closer examination it is clear that TFTs are unique and merit their own model. Understanding and interpreting measurements of organic devices, which are often seen as black-box measurements, is critical to developing better devices and this, therefore, has to be done with care. Electrical Characterization of Organic Electronic Materials and Devices Gives new insights into the electronic properties and measurement techniques for low-mobility electronic devicesCharacterizes the thin-film transistor using its own modelLinks the phenomena seen in different device structures and different measurement techniquesPresents clearly both how to perform electrical measurements of organic and low-mobility materials and how to extract important information from these measurementsProvides a much-needed theoretical foundation for organic electronics.

  • Language: English

    Published by John Wiley & Sons Inc, New York, 2009

    047075009X / 9780470750094

    • Hardcover
    • First Edition

    Seller: AussieBookSeller, Truganina, VIC, AustraliaAussieBookSeller

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    Hardcover. Condition: new. Hardcover. Think like an electron Organic electronic materials have many applications and potential in low-cost electronics such as electronic barcodes and in light emitting devices, due to their easily tailored properties. While the chemical aspects and characterization have been widely studied, characterization of the electrical properties has been neglected, and classic textbook modeling has been applied. This is most striking in the analysis of thin-film transistors (TFTs) using thick bulk transistor (MOS-FET) descriptions. At first glance the TFTs appear to behave as regular MOS-FETs. However, upon closer examination it is clear that TFTs are unique and merit their own model. Understanding and interpreting measurements of organic devices, which are often seen as black-box measurements, is critical to developing better devices and this, therefore, has to be done with care. Electrical Characterization of Organic Electronic Materials and Devices Gives new insights into the electronic properties and measurement techniques for low-mobility electronic devicesCharacterizes the thin-film transistor using its own modelLinks the phenomena seen in different device structures and different measurement techniquesPresents clearly both how to perform electrical measurements of organic and low-mobility materials and how to extract important information from these measurementsProvides a much-needed theoretical foundation for organic electronics Offers fresh insights into the electronic properties and measurement techniques for low-mobility electronic devices and characterizes the thin-film transistor using its own model. This title links the phenomena seen in different device structures and different measurement techniques. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.