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VLSI Design and Test. 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019. Revised Selected Papers.
Published by Singapore, Springer., 2019
ISBN 10: 9813297662 ISBN 13: 9789813297661
Language: English
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 5 out of 5 stars
XVI, 775 p. Softcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Communications in Computer Information Science, 1066. Sprache: Englisch.
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VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers (Communications in Computer and Information Science, 1066)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In.
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VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4¿6, 2019, Revised Selected Papers
Published by Springer Nature Singapore, 2019
ISBN 10: 9813297662 ISBN 13: 9789813297661
Language: English
Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Vlsi Design And Test : 23rd Internationa
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New.
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Taschenbuch. Condition: Neu. VLSI Design and Test | 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers | Anirban Sengupta (u. a.) | Taschenbuch | xvi | Englisch | 2019 | Springer Singapore | EAN 9789813297661 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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VLSI Design and Test
Published by Springer Nature Singapore, Springer Nature Singapore Aug 2019, 2019
ISBN 10: 9813297662 ISBN 13: 9789813297661
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. Neuware -This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 792 pp. Englisch.
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Vlsi Design and Test: 23rd International Symposium, Vdat 2019, Indore, India, July 46, 2019, Revised Selected Papers
Published by Springer-Verlag New York Inc, 2019
ISBN 10: 9813297662 ISBN 13: 9789813297661
Language: English
Paperback. Condition: Brand New. 792 pages. 9.25x6.10x1.61 inches. In Stock.
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Condition: New.
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VLSI Design and Test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers
Published by Springer Nature Singapore, Springer Nature Singapore, 2019
ISBN 10: 9813297662 ISBN 13: 9789813297661
Language: English
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.
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VLSI Design and Test
Published by Springer Nature Singapore Aug 2019, 2019
ISBN 10: 9813297662 ISBN 13: 9789813297661
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation. 792 pp. Englisch.
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Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The pa.
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