Vlsi Design and Test: 23rd International Symposium, Vdat 2019, Indore, India, July 4 6, 2019, Revised Selected Papers

Sengupta, Anirban (Editor)/ Dasgupta, Sudeb (Editor)/ Singh, Virendra (Editor)/ Sharma, Rohit (Editor)/ Vishvakarma, Santosh Kumar (Editor)

ISBN 10: 9813297662 / ISBN 13: 9789813297661

Published by Springer-Verlag New York Inc, 2019

About this Item

792 pages. 9.25x6.10x1.61 inches. In Stock.

Seller Inventory # x-9813297662

Bibliographic Details

• Title: Vlsi Design and Test: 23rd International Symposium, Vdat 2019, Indore, India, July 4 6, 2019, Revised Selected Papers
• Publisher: Springer-Verlag New York Inc
• Publication Date: 2019
• Language: English
• ISBN 10: 9813297662
• ISBN 13: 9789813297661
• Binding: Paperback
• Condition: Brand New
• Weight: 1.12 kilograms

About this title

Synopsis

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.